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TMS320VC5507 датащи(PDF) 21 Page - Texas Instruments |
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TMS320VC5507 датащи(HTML) 21 Page - Texas Instruments |
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21 / 108 page ![]() SM320VC5507-EP www.ti.com SPRS613 – SEPTEMBER 2009 Table 2-2. Signal Descriptions (continued) TERMINAL MULTIPLEXED RESET I/O/Z (1) FUNCTION BK (2) NAME SIGNAL NAME CONDITION TEST/EMULATION PINS IEEE standard 1149.1 test clock. TCK is normally a free-running clock signal with a 50% duty cycle. The changes on test access port (TAP) of input signals TMS and TDI are clocked into the TAP PU TCK I Input controller, instruction register, or selected test data H register on the rising edge of TCK. Changes at the TAP output signal (TDO) occur on the falling edge of TCK. IEEE standard 1149.1 test data input. Pin with internal pullup device. TDI is clocked into the TDI I PU Input selected register (instruction or data) on a rising edge of TCK. IEEE standard 1149.1 test data output. The contents of the selected register (instruction or TDO O/Z data) are shifted out of TDO on the falling edge of Hi-Z TCK. TDO is in the high-impedance state except when the scanning of data is in progress. IEEE standard 1149.1 test mode select. Pin with internal pullup device. This serial control input is TMS I PU Input clocked into the TAP controller on the rising edge of TCK. IEEE standard 1149.1 test reset. TRST, when high, gives the IEEE standard 1149.1 scan system control of the operations of the device. If TRST is PD TRST I not connected or driven low, the device operates Input FS in its functional mode, and the IEEE standard 1149.1 signals are ignored. This pin has an internal pulldown. Emulator 0 pin. When TRST is driven low, EMU0 must be high for activation of the OFF condition. When TRST is driven high, EMU0 is used as an EMU0 I/O/Z PU Input interrupt to or from the emulator system and is defined as I/O by way of the IEEE standard 1149.1 scan system. Emulator 1 pin/disable all outputs. When TRST is driven high, EMU1/OFF is used as an interrupt to or from the emulator system and is defined as I/O by way of IEEE standard 1149.1 scan system. When TRST is driven low, EMU1/OFF is configured as OFF. The EMU1/OFF signal, when EMU1/OFF I/O/Z PU Input active-low, puts all output drivers into the high-impedance state. Note that OFF is used exclusively for testing and emulation purposes (not for multiprocessing applications). Therefore, for the OFF condition, the following apply: TRST = low, EMU0 = high, EMU1/OFF = low. SUPPLY PINS Digital Power, + VDD. Dedicated power supply for CVDD S the core CPU. Digital Power, + VDD. Dedicated power supply for DVDD S the I/O pins. Digital Power, + VDD. Dedicated power supply for USBVDD S the I/O of the USB module (DP, DN , and PU). Digital Power, + VDD. Dedicated power supply for RDVDD S the I/O pins of the RTC module. Digital Power, + VDD. Dedicated power supply for RCVDD S the RTC module. Analog Power, + VDD. Dedicated power supply AVDD S for the 10-bit A/D. Copyright © 2009, Texas Instruments Incorporated Introduction 21 Submit Documentation Feedback Product Folder Link(s): SM320VC5507-EP |
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