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TMS320VC5507 датащи(PDF) 21 Page - Texas Instruments

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номер детали TMS320VC5507
подробное описание детали  Fixed-Point Digital Signal Processor
PDF  108 Pages
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домашняя страница  http://www.ti.com
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TMS320VC5507 датащи(HTML) 21 Page - Texas Instruments

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SM320VC5507-EP
www.ti.com
SPRS613 – SEPTEMBER 2009
Table 2-2. Signal Descriptions (continued)
TERMINAL
MULTIPLEXED
RESET
I/O/Z (1)
FUNCTION
BK (2)
NAME
SIGNAL NAME
CONDITION
TEST/EMULATION PINS
IEEE standard 1149.1 test clock. TCK is normally
a free-running clock signal with a 50% duty cycle.
The changes on test access port (TAP) of input
signals TMS and TDI are clocked into the TAP
PU
TCK
I
Input
controller, instruction register, or selected test data
H
register on the rising edge of TCK. Changes at the
TAP output signal (TDO) occur on the falling edge
of TCK.
IEEE standard 1149.1 test data input. Pin with
internal pullup device. TDI is clocked into the
TDI
I
PU
Input
selected register (instruction or data) on a rising
edge of TCK.
IEEE standard 1149.1 test data output. The
contents of the selected register (instruction or
TDO
O/Z
data) are shifted out of TDO on the falling edge of
Hi-Z
TCK. TDO is in the high-impedance state except
when the scanning of data is in progress.
IEEE standard 1149.1 test mode select. Pin with
internal pullup device. This serial control input is
TMS
I
PU
Input
clocked into the TAP controller on the rising edge
of TCK.
IEEE standard 1149.1 test reset. TRST, when
high, gives the IEEE standard 1149.1 scan system
control of the operations of the device. If TRST is
PD
TRST
I
not connected or driven low, the device operates
Input
FS
in its functional mode, and the IEEE standard
1149.1 signals are ignored. This pin has an
internal pulldown.
Emulator 0 pin. When TRST is driven low, EMU0
must be high for activation of the OFF condition.
When TRST is driven high, EMU0 is used as an
EMU0
I/O/Z
PU
Input
interrupt to or from the emulator system and is
defined as I/O by way of the IEEE standard
1149.1 scan system.
Emulator 1 pin/disable all outputs. When TRST is
driven high, EMU1/OFF is used as an interrupt to
or from the emulator system and is defined as I/O
by way of IEEE standard 1149.1 scan system.
When TRST is driven low, EMU1/OFF is
configured as OFF. The EMU1/OFF signal, when
EMU1/OFF
I/O/Z
PU
Input
active-low, puts all output drivers into the
high-impedance state. Note that OFF is used
exclusively for testing and emulation purposes
(not for multiprocessing applications). Therefore,
for the OFF condition, the following apply: TRST =
low, EMU0 = high, EMU1/OFF = low.
SUPPLY PINS
Digital Power, + VDD. Dedicated power supply for
CVDD
S
the core CPU.
Digital Power, + VDD. Dedicated power supply for
DVDD
S
the I/O pins.
Digital Power, + VDD. Dedicated power supply for
USBVDD
S
the I/O of the USB module (DP, DN , and PU).
Digital Power, + VDD. Dedicated power supply for
RDVDD
S
the I/O pins of the RTC module.
Digital Power, + VDD. Dedicated power supply for
RCVDD
S
the RTC module.
Analog Power, + VDD. Dedicated power supply
AVDD
S
for the 10-bit A/D.
Copyright © 2009, Texas Instruments Incorporated
Introduction
21
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