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MPF0900AMBA2ES датащи(PDF) 48 Page - NXP Semiconductors

номер детали MPF0900AMBA2ES
подробное описание детали  Nine-channel power management IC with advanced system safety monitoring
PDF  205 Pages
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производитель  NXP [NXP Semiconductors]
домашняя страница  http://www.nxp.com
Logo NXP - NXP Semiconductors

MPF0900AMBA2ES датащи(HTML) 48 Page - NXP Semiconductors

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NXP Semiconductors
PF09
Nine-channel power management IC with advanced system safety monitoring
corrective action before the PMIC detects a lack of response and proceeds to evaluate the fault conditions as
a hard fault.
12.6.1 Fault counter
The PF09 features a programmable fault counter to avoid fault cycling during system operation.
The device uses the FAULT_MAX_CNT[3:0] bits to set the maximum number of soft faults allowed before the
PMIC detects a cyclic fault condition and generates a hard fault condition.
When the FAULT_MAX_CNT[3:0] = 0x00, the soft fault condition will still be detected but the system will not be
able to generate a system shutdown due to a hard fault.
When the FAULT_MAX_CNT[3:0] is different from 0x00, the PMIC will generate a hard fault when the
FAULT_CNT[3:0] = FAULT_MAX_CNT[3:0].
The default value of the FAULT_MAX_CNT[3:0] bits is set by the OTP_FAULT_MAX_CNT[3:0] bits to ensure
the system starts operation with a valid configuration. However, the MCU is allowed to change the value of the
FAULT_MAX_CNT[3:0] bits at any time to adjust the PMIC reaction to the needs of the application.
If the FAULT_CNT[3:0] < FAULT_MAX_CNT[3:0], the device will initiate the corresponding fault protection
mechanism based on the type of fault and the configuration in the functional register bits.
OV, UV, and ILIM faults in the voltage regulators and external VMON will increased the fault counter only if the
fault is not bypassed, and no other persistent OV, UV, or ILIM fault is currently present on any of the system
regulators or external VMON blocks.
FCCU and ERRMON faults will increase the FAULT_CNT[3:0] only if the FS0B pin transitions from high to low,
to prevent multiple fault detections from a fault condition that hasn’t been properly cleared out by the MCU.
The MCU is expected to implement a fault acknowledgement routine to read the faults and clear the fault
counter when it has taken proper action, and the system is ready to resume normal operation. By implementing
such a routine, the system ensures that no fault conditions are stacking up in the fault counter and prevents a
random condition from generating a hard fault right away.
The fault counter can be cleared manually by writing the FAULT_CNT[3:0] = 0x00 via an I2C command, or
automatically by allowing the watchdog interface to reduce the counter gradually when a number of consecutive
good watchdog refreshes have been performed. Refer to Section 14.4.3 for more details on using the watchdog
interface to decrease the fault counter automatically.
12.6.2 System regulators and external VMON fault management
The switching regulators and LDOs are provided with internal voltage monitors to detect overvoltage (OV)
and undervoltage (UV) conditions during the Power-up sequence and the SYSTEM ON states. Additionally,
overcurrents are detected and protected during the system-on states by the ILIM mechanism.
Note that the voltage monitoring is only able to detect and protect against OV/UV conditions in the monitored
STANDBY state (OTP_LP_STBY = 0). If the device is configured to go into the low-power STANDBY state,
all monitoring blocks will be disabled to allow the lowest quiescent current possible with the assumption that
STANDBY is considered a safe state in which the system will not perform critical activity, therefore no safety
monitoring is required.
Refer to Section 13.3 for detailed operation and configuration of the OV/UV monitoring blocks.
Fault reaction of the system regulators and external voltage monitors can be managed through the dedicated
fault management bit provided for each block.
PF09
All information provided in this document is subject to legal disclaimers.
© 2026 NXP B.V. All rights reserved.
Product data sheet
Rev. 1.3 — 16 December 2025
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