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MPF0900AMBA2ES датащи(PDF) 29 Page - NXP Semiconductors

номер детали MPF0900AMBA2ES
подробное описание детали  Nine-channel power management IC with advanced system safety monitoring
PDF  205 Pages
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производитель  NXP [NXP Semiconductors]
домашняя страница  http://www.nxp.com
Logo NXP - NXP Semiconductors

MPF0900AMBA2ES датащи(HTML) 29 Page - NXP Semiconductors

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NXP Semiconductors
PF09
Nine-channel power management IC with advanced system safety monitoring
VIN_OV monitoring is provided with a programmable debounce to select the filtering time to detect
a VIN_OV event. The default value for the VIN_OV_DBNC[1:0] is set in the OTP registers via the
OTP_VIN_OV_DBNC[1:0] bits.
VIN_OV_DBNC[1:0]
VIN OV debounce value (us)
00
10
01
100
10
1000
11
Reserved
Table 25. VIN_OV_DBNC bit field
Symbol
Description
Min
Typ
Max
Unit
VIN_OV
VIN overvoltage rising
5.65
5.8
5.95
V
VIN_OV_HYS
VIN overvoltage hysteresis
50
100
125
mV
Table 26. VIN_OV electrical characteristics
12.3 Device power-up
12.3.1 IC startup
The PF09 provides a quick startup time from the point VIN crosses the VIN_POR threshold until the RSTB pin is
released.
For practical purposes, the power-up timing is considered from the wake-up event (exit ULPOFF or exit the
DFS) until the device is ready to start the power-up sequence (PWRUP_READY), assuming no event is gating
the power-up sequence.
In devices with high safety integrity levels (ASIL/SIL) where the LBIST is available, the LBIST routine will be
performed as part of the initial configuration right after the wake-up event and will be followed by a fresh fuse
loading.
In devices with no LBIST available, the initial configuration requires only a single fuse loading event, thus
reducing the overall turn-on time.
When VAON is configured as a system regulator, the VAON supply can be configured to turn on during the
power-up sequence, and it will not be considered as a gating factor to reach PWRUP_READY condition.
Pulling up the PWRON pin to VIN or VAON is possible to ensure an automatic PWRON event at cold boot
before the system MCU can take over the control of the PWRON pin. In that scenario, the PWRON event will be
evaluated after the fuse-loading routine is finished (entering the LPOFF state).
PF09
All information provided in this document is subject to legal disclaimers.
© 2026 NXP B.V. All rights reserved.
Product data sheet
Rev. 1.3 — 16 December 2025
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