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MPF0900AMBA2ES датащи(PDF) 29 Page - NXP Semiconductors |
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MPF0900AMBA2ES датащи(HTML) 29 Page - NXP Semiconductors |
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29 / 205 page ![]() NXP Semiconductors PF09 Nine-channel power management IC with advanced system safety monitoring VIN_OV monitoring is provided with a programmable debounce to select the filtering time to detect a VIN_OV event. The default value for the VIN_OV_DBNC[1:0] is set in the OTP registers via the OTP_VIN_OV_DBNC[1:0] bits. VIN_OV_DBNC[1:0] VIN OV debounce value (us) 00 10 01 100 10 1000 11 Reserved Table 25. VIN_OV_DBNC bit field Symbol Description Min Typ Max Unit VIN_OV VIN overvoltage rising 5.65 5.8 5.95 V VIN_OV_HYS VIN overvoltage hysteresis 50 100 125 mV Table 26. VIN_OV electrical characteristics 12.3 Device power-up 12.3.1 IC startup The PF09 provides a quick startup time from the point VIN crosses the VIN_POR threshold until the RSTB pin is released. For practical purposes, the power-up timing is considered from the wake-up event (exit ULPOFF or exit the DFS) until the device is ready to start the power-up sequence (PWRUP_READY), assuming no event is gating the power-up sequence. In devices with high safety integrity levels (ASIL/SIL) where the LBIST is available, the LBIST routine will be performed as part of the initial configuration right after the wake-up event and will be followed by a fresh fuse loading. In devices with no LBIST available, the initial configuration requires only a single fuse loading event, thus reducing the overall turn-on time. When VAON is configured as a system regulator, the VAON supply can be configured to turn on during the power-up sequence, and it will not be considered as a gating factor to reach PWRUP_READY condition. Pulling up the PWRON pin to VIN or VAON is possible to ensure an automatic PWRON event at cold boot before the system MCU can take over the control of the PWRON pin. In that scenario, the PWRON event will be evaluated after the fuse-loading routine is finished (entering the LPOFF state). PF09 All information provided in this document is subject to legal disclaimers. © 2026 NXP B.V. All rights reserved. Product data sheet Rev. 1.3 — 16 December 2025 Document feedback 29 / 205 |
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