MPF0900AMBA2ES datasheet(165/205 Pages) NXP

165 / 205 page

NXP Semiconductors

PF09

Nine-channel power management IC with advanced system safety monitoring

When LBIST is available in the system, it will be performed during the power-on event when the OTP fuses

are loaded. Because the LBIST routine requires a considerable amount of time to be performed, the system

designer must take into consideration the extra time needed for the LBIST test for every power-on cycle.

During the LBIST routine, the PF09 will test the logic gates controlling the following safety-related mechanisms:

• OV/UV monitoring logic and deglitchers

• FCCU inputs

• ERRMON input

• Watchdog management

• Dynamic CRC

• FS0B control logic (on main)

• PGOOD control logic

• DMS interface logic (on main)

If the LBIST routine is failed at power-up, the PF09 will not be able to start a power-up sequence to prevent a

startup with a potential single-point or latent failure.

For debugging purposes, the LBIST_STATUS[1:0] bits are provided to read the status/result of the LBIST during

the DBGOFF state in the event the LBIST has failed.

LBIST_STATUS[1:0]

LBIST status

LBIST not executed

Test in progress

LBIST Failed

LBIST Passed

Table 219. LBIST status bits

14.10.2 LBIST on demand

The LBIST on-demand routine can be requested at any time during the RUN state by sending the system

command SYS_CMD = 0x4A. It is intended to provide coverage for latent failures in the digital signals

controlling the safety mechanism on an automotive system with very long drive cycles, or an industrial system

with always-on operating cycles.

To request LBIST on demand:

1. Read all save the Registers content:

• LDO1_SEQ[7:0]

• LDO2_SEQ[7:0]

• LDO3_SEQ[7:0]

• SW1_SEQ[7:0]

• SW2_SEQ[7:0]

• SW3_SEQ[7:0]

• SW4_SEQ[7:0]

• SW5_SEQ[7:0]

• VAON_SEQ[7:0]

• VAON[1:0]

• VLDO1_RUN[4:0]

• VLDO2_RUN[4:0]

• VLDO3_RUN[4:0]

• VSW1_RUN[7:0]

PF09

All information provided in this document is subject to legal disclaimers.

Product data sheet

Rev. 1.3 — 16 December 2025

Document feedback

165 / 205

MPF0900AMBA2ES датащи(PDF) 165 Page - NXP Semiconductors

MPF0900AMBA2ES датащи(HTML) 165 Page - NXP Semiconductors

Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 61 62 63 64 65 66 67 68 69 70 71 72 73 74 75 76 77 78 79 80 81 82 83 84 85 86 87 88 89 90 91 92 93 94 95 96 97 98 99 100 ...More

датащи скачать

ссылки URL