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SC28L201 датащи(PDF) 95 Page - NXP Semiconductors |
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SC28L201 датащи(HTML) 95 Page - NXP Semiconductors |
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95 / 110 page ![]() 9397 750 13138 © Koninklijke Philips Electronics N.V. 2005. All rights reserved. Product data sheet Rev. 01 — 31 October 2005 95 of 110 Philips Semiconductors SC28L201 3.3 V, 5 V UART, 3.125 Mbit/s, with 256-byte FIFO [1] Test conditions for outputs: CL = 85 pF, except interrupt outputs. Test conditions for interrupt outputs: CL =85pF, RL = 2.7 kΩ to VDD. [2] Timing is illustrated and referenced to the WRN and RDN inputs. Also, CEN may be the ‘strobing’ input. CEN and RDN (also CEN and WRN) are ORed internally. The signal asserted last initiates the cycle and the signal negated first terminates the cycle. [3] Guaranteed by characterization of sample units. [4] If CEN is used as the ‘strobing’ input, the parameter defines the minimum HIGH times between one CEN and the next. The RDN signal must be negated for td(RWD) time to guarantee that any Status Register changes are valid. [5] Minimum frequencies are not tested, but are guaranteed by design. [6] Clocks for 1 × mode should be reasonably symmetrical. [7] Data is usually setup with respect to CEN going LOW (the leading edge of CEN). This mode strongly implies the use of DACKN. (Its use is not strictly required.) DACKN is derived from the X1/SCLK input. It is seldom that the system clocks that ultimately drive the CEN, address, and R/WN signals are synchronous to the X1/SCLK. If address, data, R/WN are setup before CEN goes LOW and hold through DACKN, the timing parameters above will be guaranteed. th(D)(mot) CEN HIGH to data hold time 0-0- ns tsu(An-CENL)(mot) address to CEN LOW setup time 10-10- ns th(CENL-An)(mot) CEN LOW to address hold time 10 - 10 - ns tDv(CENL) CEN LOW to data valid time - 45 - 35 ns td(RWD)(mot) read and write cycle HIGH time [2] [4] 10-10- ns tDCR X1/SCLK HIGH to DACKN LOW time (read cycle) - 35 - 35 ns tDCW X1/SCLK HIGH to DACKN LOW time (write cycle) - 30 - 25 ns tDAT CEN to IACKN HIGH DACKN high-impedance time - 15 - 15 ns tCSC CEN or IACKN to X1/SCLK HIGH setup time for minimum DACKN cycle 10 - 10 - ns Table 82: Dynamic characteristics …continued Tamb = −40 °C to +85 °C; voltage tolerance ± 10 %; unless otherwise specified. [1] Symbol Parameter Conditions VDD = 3.3 V VDD =5V Unit Min Max Min Max |
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