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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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LFSC датащи(PDF) 46 Page - Lattice Semiconductor |
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LFSC датащи(HTML) 46 Page - Lattice Semiconductor |
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46 / 237 page  3-2 DC and Switching Characteristics Lattice Semiconductor LatticeSC/M Family Data Sheet Power Supply Ramp Rates Hot Socketing Specifications 1 DC Electrical Characteristics 5 Over Recommended Operating Conditions Symbol Parameter Condition Min. Typ. Max Units tRAMP Power supply ramp rates for all power supplies Over process, voltage, temperature 3.45 — — mV/µs — — 75 ms 1. See the Power-up and Power-Down requirements section for more details on power sequencing. 2. From 0.5V to minimum operating voltage. Symbol Parameter Condition Min. Typ. Max Units IDK Programmable and dedicated Input or I/O leakage current 2, 3, 4, 5, 6 0 <= VIN <= VIH (MAX) — — ±1500 µA IHDIN SERDES average input current when device powered down and inputs driven 7 —— 4 mA 1. See Hot Socket power up/down information in Chapter 2 of this document. 2. Assumes monotonic rise/fall rates for all power supplies. 3. Sensitive to power supply sequencing as described in hot socketing section. 4. Assumes power supplies are between 0 and maximum recommended operations conditions. 5. IDK is additive to IPU, IPD or IBH. 6. Represents DC conditions. For the first 20ns after hot insertion, current specification is 8 mA. 7. Assumes that the device is powered down with all supplies grounded, both P and N inputs driven by a CML driver with maximum allowed VDDOB of 1.575V, 8b/10b data and internal AC coupling. Symbol Parameter Condition Min. 3 Typ. Max. Units IIL, IIH 1 Input or I/O Low leakage 0 ≤ VIN ≤ VIH (MAX) — — 10 µA IPU I/O Active Pull-up Current 0 ≤ VIN ≤ 0.7 VCCIO -30 — -210 µA IPD I/O Active Pull-down Cur- rent VIL (MAX) ≤ VIN ≤ VIH (MAX) 30 — 210 µA IBHLS Bus Hold Low Sustaining Current VIN = VIL (MAX) 30 — — µA IBHHS Bus Hold High Sustaining Current VIN = 0.7VCCIO -30 — — µA IBHLO Bus Hold Low Overdrive Current 0 ≤ VIN ≤ VIH (MAX) — — 210 µA IBHLH Bus Hold High Overdrive Current 0 ≤ VIN ≤ VIH (MAX) — — -210 µA ICL PCI Low Clamp Current -3 < VIN ≤ -1 -25 + (VIN + 1)/0.015 — — mA ICH PCI High Clamp Current VCC + 4 > VIN ≥ VCC + 1 25 + (VIN - VCC -1)/ 0.015 —— mA VBHT Bus Hold trip Points 0 ≤ VIN ≤ VIH (MAX) VIL (MAX) — VIH (MIN) V C1 I/O Capacitance 2 VCCIO = 3.3V, 2.5V, 1.8V, 1.5V, 1.2V, VCC = 1.2V, VCCIP2 = 1.2V, VCCAUX = 2.5, VIO = 0 to VIH (MAX) —8 — pf C3 2 Dedicated Input Capacitance 2 VCCIO = 3.3V, 2.5V, 1.8V, 1.5V, 1.2V, VCC = 1.2V, VCCIP2 = 1.2V, VCCAUX = 2.5, VIO = 0 to VIH (MAX) —6 — pf 1. Input or I/O leakage current is measured with the pin configured as an input or as an I/O with the output driver tri-stated. It is not measured with the output driver active. Bus maintenance circuits are disabled. 2. TA 25°C, f = 1.0MHz 3. IPU, IPD, IBHLS and IBHHS have minimum values of 15 or -15µA if VCCIO is set to 1.2V nominal. 4. This table does not apply to SERDES pins. 5. For programmable I/Os. |
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