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MSP430 датащи(PDF) 40 Page - Texas Instruments

номер детали MSP430
подробное описание детали  AFEx8101 16-Bit and 14-Bit, Low-Power DACs With Voltage Reference and Diagnostic ADC for 4-mA to 20-mA Loop-Powered Applications
PDF  88 Pages
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7.3.3.6 Fault Detection
There are two fields within the ADC_CFG register: FLT_CNT and HYST. These fields are applied to the
assertion and deassertion of alarm conditions for all the ADC channels.
ADC_CFG.FLT_CNT determines the number of consecutive failures needed to trip an alarm condition. For
example, if ADC_CFG.FLT_CNT is set for three counts, then three consecutive conversions must be outside
of the thresholds. Each failure counts towards the FLT_CNT limit even if the failures alternate between high
threshold and low threshold.
ADC_CFG.HYST sets the hysteresis used by the alarm-detection circuit. After an alarm is triggered, the
hysteresis is applied before the alarm condition is released. In the case of the high threshold, the hysteresis
is subtracted from the threshold value. In the case of the low threshold limit, the hysteresis is added to the
threshold value.
Channels AIN0, AIN1, and TEMP have high and low thresholds associated with them. If a conversion value falls
outside of these limits (that is, if TEMP < low threshold or TEMP > high threshold), an alarm condition for that
channel is set. The alarms are disabled by setting 0x000 for the low threshold and 0xFFF for the high threshold,
respectively. These alarms are disabled by default. Because the configuration fields for the thresholds are only
eight bits wide, the four LSBs are hardcoded for each threshold. The high thresholds four LSBs are hardcoded to
0xF, and the low thresholds four LSBs are hardcoded to 0x0.
All the self diagnostic (SD) channels have fixed thresholds, except SD4, which measures the VOUT of the main
DAC. The threshold for SD4 tracks the VOUT with respect to the DAC code. Table 7-7 shows the calculations
used to determine the high and low ADC thresholds for each SD channel. The limits in the two right-most
columns are determined by the threshold columns to the left and given some margin. The four LSBs are
assigned as described previously.
Table 7-7. Self Diagnostic (SD) Alarm ADC Thresholds
SD
ADC
INPUT
ACCEPTED LOW
VALUE
ACCEPTED HIGH
VALUE
LOW
THRESHOLD
HIGH
THRESHOLD
ADC LOW (HEX) ADC HIGH (HEX)
SD0
VREF/2 VREF/2 – 9% – 25 mV VREF/2 + 9% + 25 mV
0.54375 V
0.70625 V
0x6D0
0x92F
SD1
PVDD/6
1.65/6 – 25 mV
6/6 + 25 mV
0.25 V
1.025 V
0x310
0xD3F
SD2
VDD/2
1.6/2 – 25 mV
2/2 + 25 mV
0.775 V
1.025 V
0x9C0
0xD3F
SD3
0.6 V
0.6 V – 9% – 25 mV
0.6 V + 9% + 25 mV
0.521 V
0.679 V
0x690
0x8CF
SD4
VOUT/2
VOUT/2 – 6 mV
VOUT/2 + 6 mV
VOUT – 12 mV VOUT + 12 mV Expected – 0x040 Expected + 0x040
The alarm threshold for the SD4 input depends on the expected ADC measurement based on the DAC code.
The threshold is different for each DAC range and is adjusted accordingly. Equation 9 shows the expected ADC
code for RANGE = 0, and Equation 10 shows the expected ADC code for RANGE = 1.
ADCExpectedCode:RANGE0= DAC_CODEMSB:MSB–11×113÷128 +492
2
(9)
ADCExpectedCode:RANGE1= DAC_CODEMSB:MSB–11×82÷128 +655
2
(10)
AFE78101, AFE88101
SLASF21 – DECEMBER 2022
www.ti.com
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Product Folder Links: AFE78101 AFE88101



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