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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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ST20-GP6 датащи(PDF) 121 Page - STMicroelectronics |
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ST20-GP6 датащи(HTML) 121 Page - STMicroelectronics |
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121 / 123 page  ST20-GP6 121/123 23 Test access port The ST20-GP6 Test Access Port (TAP) conforms to IEEE standard 1149.1. The TAP consists of five pins: TMS, TCK, TDI, TDO and notTRST. The instruction register is 5 bits long, with no parity, and the pattern “00001” is loaded into the reg- ister during the Capture-IR state. There are four defined public instructions, see Table 23.1. All other instruction codes are reserved. There are three test data registers; Bypass, Boundary-Scan and Identification. These registers operate according to 1149.1. The Boundary-Scan register is not supported on the ST20-GP6. Instruction codea a. MSB ... LSB; LSB closest to TDO. Instruction Selected register 0 0 0 0 0 EXTEST Boundary-Scan 0 0 0 1 0 IDCODE Identification 0 0 0 1 1 SAMPLE/PRELOAD Boundary-Scan 1 1 1 1 1 BYPASS Bypass Table 23.1 Instruction codes |
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