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PI7C8150BMA-33 датащи(PDF) 95 Page - Pericom Semiconductor Corporation |
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PI7C8150BMA-33 датащи(HTML) 95 Page - Pericom Semiconductor Corporation |
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95 / 107 page ![]() PI7C8150B ASYNCHRONOUS 2-PORT PCI-TO-PCI BRIDGE Page 95 of 107 April 2015 – Revision 2.1 read data. Again, the PAR signal corresponds to read data from the previous data phase cycle. 15.2.3 REPORTING PARITY ERRORS For all address phases, if a parity error is detected, the error should be reported on the P_SERR_L signal by asserting P_SERR_L for one cycle and then 3-stating two cycles after the bad address. P_SERR_L can only be asserted if bit 6 and 8 in the Command Register are both set to 1. For write data phases, a parity error should be reported by asserting the P_PERR_L signal two cycles after the data phase and should remain asserted for one cycle when bit 6 in the Command register is set to a 1. The target reports any type of data parity errors during write cycles, while the master reports data parity errors during read cycles. Detection of an address parity error will cause the PCI-to-PCI Bridge target to not claim the bus (P_DEVSEL_L remains inactive) and the cycle will then terminate with a Master Abort. When the bridge is acting as master, a data parity error during a read cycle results in the bridge master initiating a Master Abort. 15.2.4 SECONDARY IDSEL MAPPING When PI7C8150B detects a Type 1 configuration transaction for a device connected to the secondary, it translates the Type 1 transaction to Type 0 transaction on the downstream interface. Type 1 configuration format uses a 5-bit field at P_AD[15:11] as a device number. This is translated to S_AD[31:16] by PI7C8150B. 16 IEEE 1149.1 COMPATIBLE JTAG CONTROLLER An IEEE 1149.1 compatible Test Access Port (TAP) controller and associated TAP pins are provided to support boundary scan in PI7C8150B for board-level continuity test and diagnostics. The TAP pins assigned are TCK, TDI, TDO, TMS and TRST_L. All digital input, output, input/output pins are tested except TAP pins. The IEEE 1149.1 Test Logic consists of a TAP controller, an instruction register, and a group of test data registers including Bypass and Boundary Scan registers. The TAP controller is a synchronous 16-state machine driven by the Test Clock (TCK) and the Test Mode Select (TMS) pins. An independent power on reset circuit is provided to ensure the machine is in TEST_LOGIC_RESET state at power-up. The JTAG signal lines are not active when the PCI resource is operating PCI bus cycles. PI7C8150B implements 3 basic instructions: BYPASS, SAMPLE/PRELOAD, and EXTEST. 16.1 BOUNDARY SCAN ARCHITECTURE Boundary-scan test logic consists of a boundary-scan register and support logic. These are accessed through a Test Access Port (TAP). The TAP provides a simple serial interface that allows all processor signal pins to be driven and/or sampled, thereby providing direct control and monitoring of processor pins at the system level. 15-0048 |
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