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TMPR4955AF датащи(PDF) 136 Page - Toshiba Semiconductor |
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TMPR4955AF датащи(HTML) 136 Page - Toshiba Semiconductor |
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136 / 168 page ![]() Chapter 7 JTAG Interface 7-2 7.2 Signal Summary The JTAG interface signals are listed below and shown in Figure 7.2.1. • JTDI JTAG serial data in • JTDO JTAG serial data out • JTMS JTAG test mode select • JTCK JTAG serial clock input • TRST JTAG test reset input Figure 7.2.1 JTAG Interface Signals and Registers The JTAG boundary-scan mechanism (referred to in this chapter as JTAG mechanism) allows testing of the connections between the processor, the printed circuit board to which it is attached, and the other components on the circuit board. The JTAG mechanism does not provide any capability for testing the processor itself. 70 Instruction register TAP Controller 0 Bypass register 0 86 Boundary-scan register 31 0 Device Identification register JTDI pin JTD0 pin JTMS pin JTCK pin TRST* pin |
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