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VSC8221 датащи(PDF) 45 Page - Microsemi Corporation |
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VSC8221 датащи(HTML) 45 Page - Microsemi Corporation |
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45 / 138 page ![]() VSC8221 Data Sheet VMDS-10106 Revision 4.1 December 2006 45 of 46 46 14.1 Supported instructions and instruction Codes After a TAP reset, the Device identification Register is serially connected between TDi and TDO by default. The TAP instruction Register is loaded either from a shift register (when a new instruction is shifted in), or, if there is no new instruction in the shift register, a hard-wired default value of 0110 (iDCODE) is loaded. Using this method, there is always a valid code in the instruction register, and the problem of toggling instruction bits during a shift is avoided. Unused codes are mapped to the BYPASS instruction. The VSC8221 supports the instruction codes listed in the following table and described below. EXTEST The mandatory EXTEST instruction allows testing of off-chip circuitry and board-level interconnections by sampling input pins and loading data onto output pins. Outputs are driven by the contents of the boundary-scan cells, which have to be updated with valid values (with the PRELOAD instruction) prior to the EXTEST instruction.1 SAMPLE/PRELOAD The mandatory SAMPLE/PRELOAD instruction allows a snapshot of inputs and outputs during normal system operation to be taken and examined. it also allows data values to be loaded into the boundary-scan cells prior to the selection of other boundary-scan test instructions. iDCODE The optional iDCODE instruction provides the version number (bits 31:28), part number (bits 27:12), and Microsemi’s manufacturer identity (bits 11:1) to be serially read from the PHY. CLAMP The optional CLAMP instruction allows the state of the signals driven from the component pins to be determined from the Boundary-Scan Register while the Bypass Register is selected as the serial path between TDi and TDO. While the CLAMP instruction is selected, the signals driven from the component pins will not change.1 HiGHZ The optional HiGHZ instruction places the component in a state in which all of its system logic outputs are placed in a high impedance state. in this state, an in-circuit test system may drive signals onto the connections normally driven by a component output without incurring a risk of damage to the component. This makes it possible to use a board where not all of the components are compatible with the iEEE 1149.1 standard.1 Table 24. JTAG interface instruction Codes instruction Code Selected Register Register Width Specification EXTEST 0000 Boundary-Scan Register 72 Mandatory iEEE 1149.1 SAMPLE/PRELOAD 0001 Boundary-Scan Register 72 Mandatory iEEE 1149.1 iDCODE 0110 Device identification Register 32 Optional iEEE 1149.1 CLAMP 0010 Bypass Register 1 Optional iEEE 1149.1 HiGHZ 0011 Bypass Register 1 Optional iEEE 1149.1 BYPASS 0111 Bypass Register 1 Mandatory iEEE 1149.1 Reserved 0100, 1000, 1001, 1010, 1011, 1100, 1101,1110, 1111 1Following the use of this instruction, the on-chip system logic may be in an indeterminate state that will persist until a system reset is applied. Therefore, the on-chip system logic may need to be reset on return to normal (i.e., non-test) operation. |
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