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VSC8221 датащи(PDF) 45 Page - Microsemi Corporation

номер детали VSC8221
подробное описание детали  Single Port 10/100/1000BASE-T PHY with1.25 Gbps SerDes for SFPs/GBICs
PDF  138 Pages
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производитель  MICROSEMI [Microsemi Corporation]
домашняя страница  http://www.microsemi.com
Logo MICROSEMI - Microsemi Corporation

VSC8221 датащи(HTML) 45 Page - Microsemi Corporation

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VSC8221
Data Sheet
VMDS-10106 Revision 4.1
December 2006
45 of 46
46
14.1 Supported instructions and instruction Codes
After a TAP reset, the Device identification Register is serially connected between TDi and TDO by default. The TAP instruction
Register is loaded either from a shift register (when a new instruction is shifted in), or, if there is no new instruction in the shift
register, a hard-wired default value of 0110 (iDCODE) is loaded. Using this method, there is always a valid code in the
instruction register, and the problem of toggling instruction bits during a shift is avoided. Unused codes are mapped to the
BYPASS instruction.
The VSC8221 supports the instruction codes listed in the following table and described below.
EXTEST
The mandatory EXTEST instruction allows testing of off-chip circuitry and board-level interconnections by sampling input pins
and loading data onto output pins. Outputs are driven by the contents of the boundary-scan cells, which have to be updated with
valid values (with the PRELOAD instruction) prior to the EXTEST instruction.1
SAMPLE/PRELOAD
The mandatory SAMPLE/PRELOAD instruction allows a snapshot of inputs and outputs during normal system operation to be
taken and examined. it also allows data values to be loaded into the boundary-scan cells prior to the selection of other
boundary-scan test instructions.
iDCODE
The optional iDCODE instruction provides the version number (bits 31:28), part number (bits 27:12), and Microsemi’s
manufacturer identity (bits 11:1) to be serially read from the PHY.
CLAMP
The optional CLAMP instruction allows the state of the signals driven from the component pins to be determined from the
Boundary-Scan Register while the Bypass Register is selected as the serial path between TDi and TDO. While the CLAMP
instruction is selected, the signals driven from the component pins will not change.1
HiGHZ
The optional HiGHZ instruction places the component in a state in which all of its system logic outputs are placed in a high
impedance state. in this state, an in-circuit test system may drive signals onto the connections normally driven by a component
output without incurring a risk of damage to the component. This makes it possible to use a board where not all of the
components are compatible with the iEEE 1149.1 standard.1
Table 24. JTAG interface instruction Codes
instruction
Code
Selected Register
Register Width
Specification
EXTEST
0000
Boundary-Scan Register
72
Mandatory iEEE 1149.1
SAMPLE/PRELOAD
0001
Boundary-Scan Register
72
Mandatory iEEE 1149.1
iDCODE
0110
Device identification Register
32
Optional iEEE 1149.1
CLAMP
0010
Bypass Register
1
Optional iEEE 1149.1
HiGHZ
0011
Bypass Register
1
Optional iEEE 1149.1
BYPASS
0111
Bypass Register
1
Mandatory iEEE 1149.1
Reserved
0100, 1000,
1001, 1010,
1011, 1100,
1101,1110,
1111
1Following the use of this instruction, the on-chip system logic may be in an indeterminate state that will persist until a system reset is applied.
Therefore, the on-chip system logic may need to be reset on return to normal (i.e., non-test) operation.



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