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K32L2AX датащи(PDF) 35 Page - NXP Semiconductors

номер детали K32L2AX
подробное описание детали  K32 L2A Microcontroller with 512 KB Flash and 128 KB SRAM
PDF  96 Pages
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производитель  NXP [NXP Semiconductors]
домашняя страница  http://www.nxp.com
Logo NXP - NXP Semiconductors

K32L2AX датащи(HTML) 35 Page - NXP Semiconductors

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Table 10. ESD handling ratings (continued)
Symbol
Description
Min.
Max.
Unit
Notes
ILAT
Latch-up current at ambient temperature of 105 °C
–100
+100
mA
3
1. Determined according to JEDEC Standard JESD22-A114, Electrostatic Discharge (ESD) Sensitivity Testing Human
Body Model (HBM).
2. Determined according to JEDEC Standard JESD22-C101, Field-Induced Charged-Device Model Test Method for
Electrostatic-Discharge-Withstand Thresholds of Microelectronic Components.
3. Determined according to JEDEC Standard JESD78, IC Latch-Up Test.
6.4 Voltage and current operating ratings
Table 11. Voltage and current operating ratings
Symbol
Description
Min.
Max.
Unit
VDD
Digital supply voltage
–0.3
3.8
V
IDD
Digital supply current
120
mA
VIO
IO pin input voltage
–0.3
VDD + 0.3
V
ID
Instantaneous maximum current single pin limit (applies to
all port pins)
–25
25
mA
VDDA
Analog supply voltage
VDD – 0.3
VDD + 0.3
V
VUSB_DP
USB_DP input voltage
–0.3
3.63
V
VUSB_DM
USB_DM input voltage
–0.3
3.63
V
VREGIN
USB regulator input
–0.3
6.0
V
7 General
7.1 AC electrical characteristics
Unless otherwise specified, propagation delays are measured from the 50% to the 50%
point, and rise and fall times are measured at the 20% and 80% points, as shown in the
following figure.
General
K32 L2A Microcontroller with 512 KB Flash and 128 KB SRAM, Rev. 3, 02/2021
35
NXP Semiconductors



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