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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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BQ76PL536APAPR датащи(PDF) 11 Page - Texas Instruments |
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BQ76PL536APAPR датащи(HTML) 11 Page - Texas Instruments |
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11 / 74 page  bq76PL536A www.ti.com SLUSAD3B – JUNE 2011 – REVISED JANUARY 2016 Electrical Characteristics (continued) Typical values stated where TA = 25°C and VBAT = 20 V, Min/Max values stated where TA = –40°C to 85°C and VBAT = 7.2 V to 27 V (unless otherwise noted) PARAMETER TEST CONDITION MIN TYP MAX UNIT Voltage delta between VDELTA_FALL VUVLO – VPOR (VBAT falling) 0.4 0.52 0.7 V trip points BATTERY PROTECTION THRESHOLDS OV detection threshold VOVR 2 5 V range(7) OV detection threshold ΔVOVS 50 mV program step VOVH OV detection hysteresis 50 mV OV detection threshold VOVA1 3.3 ≤ VOV_SET ≤ 4.5 –50 0 50 mV accuracy OV detection threshold VOVA2 VOV_SET < 3.3 or VOV_SET > 4.5 –70 0 70 mV accuracy UV detection threshold VUVR 700 3300 mV range(7) UV detection threshold ΔVUVS 100 mV program step VUVH UV detection hysteresis 100 mV UV detection threshold VUVA –100 0 100 mV accuracy OT detection threshold VOTR VREG50 = 5 V 1 2 V range(8) OT detection threshold ΔVOTS See (9) V program step(8) OT detection threshold VOTA T = 40°C to 90°C 0.04 0.05 V accuracy(8) ΔVOTH OT reset hysteresis T = 40°C to 90°C 8% 12% 15% BATTERY PROTECTION DELAY TIMES OV detection delay-time tOV 0 3200 ms range COVT [µs] = 0 100 µs OV detection delay-time ΔtOV step COVT [ms] = 1 100 ms UV detection delay-time tUV 0 3200 ms range CUVT[7] (µs) = 0 100 µs UV detection delay-time ΔtUV step CUVT[7] (ms) = 1 100 ms OT detection delay-time tOT 0 2550 ms range OT detection delay-time ΔtOT 10 ms step OV, UV, and OT tacr detection delay-time CUVT, (COVT) ≥ 500 µs –12% 0% 10% accuracy(10) Protection comparator t(DETECT) VOT or VOV or VUV threshold exceeded by 10 mV 100 µs detection time (7) COV and CUV thresholds must be set such that COV – CUV ≥ 300 mV. (8) Using recommended components. Consult Table 2 in text for voltage levels used. (9) See Table 2 for trip points. (10) Under double or multiple fault conditions (of a single type), the second or greater fault may have its delay time shortened by up to the step time for the fault. For example, the second and subsequent COV faults occurring within the delay time period for the first fault may have their delay time shortened by up to 100 µs. Copyright © 2011–2016, Texas Instruments Incorporated Submit Documentation Feedback 11 Product Folder Links: bq76PL536A |
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