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TMPR4955AF датащи(PDF) 142 Page - Toshiba Semiconductor

номер детали TMPR4955AF
подробное описание детали  64-Bit TX System RISC TX49 Family
PDF  168 Pages
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производитель  TOSHIBA [Toshiba Semiconductor]
домашняя страница  http://www.semicon.toshiba.co.jp/eng
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TMPR4955AF датащи(HTML) 142 Page - Toshiba Semiconductor

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Chapter 7 JTAG Interface
7-8
•
Test-Logic-Reset
When the TAP controller is in the Reset state, the value 0x3 is loaded into the
parallel output latch, selecting the Device Identification register as default. The
three most significant bits of the Boundary-scan register are cleared to 0, disabling
the outputs.
The controller remains in this state while JTMS is high. If JTMS is held low while
the controller is in this state, then the controller moves to the Run-Test/Idle state.
•
Run-Test/Idle
In the Run-Test/Idle state, the IC is put in a test mode only when certain
instructions such as a built-in self test (BIST) instruction are present. For
instructions that do not cause any activities in this state, all test data registers
selected by the current instruction retain their previous states.
The controller remains in this state while JTMS is held low. When JTMS is high,
the controller moves to the Select-DR-Scan state.
•
Select-DR-Scan
This is a temporary controller state. Here, the IC does not execute any specific
functions.
If JTMS is held low when the controller is in this state, then the controller moves
to the Capture-DR state. If JTMS is held high, the controller moves to the
Select-IR-Scan state in the instruction column.
•
Select-IR-Scan
This is a temporary controller state. Here, the IC does not execute any specific
functions.
If JTMS is held low when the controller is in this state, then the controller moves
to the Capture-IR state. If JTMS is held high, the controller returns to the
Test-Logic-Reset state.
•
Capture-DR
In this controller state, if the test data register selected by the current instruction
on the rising edge of JTCK has parallel inputs, then data can be parallel-loaded
into the shift portion of the data register. If the test data register does not have
parallel inputs, or if data need not be loaded into the selected data register, then
the data register retains its previous state.
If JTMS is held low while the controller is in this state, the controller moves to the
Shift-DR state. If JTMS is held high, the controller moves to the Exit1-DR state.
•
Shift-DR
In this controller state, the test data register connected between JTDI and JTDO
shifts data one stage forward towards its serial output.
When the controller is in this state, then it remains in the Shift-DR state if JTMS
is held low, or moves to the Exit1-DR state if JTMS is held high.



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