LPC2917SLASH01 datasheet(70/86 Pages) NXP

70 / 86 page

LPC2917_19_01_2

Preliminary data sheet

Rev. 02 — 17 June 2009

70 of 86

NXP Semiconductors

LPC2917/01; LPC2919/01

ARM9 microcontroller with CAN and LIN

9.2 Dynamic characteristics: I2C-bus interface

[1]

All parameters are guaranteed over the virtual junction temperature range by design. Pre-testing is performed at Tamb =85 °C ambient

temperature on wafer level. Cased products are tested at Tamb =25 °C (ﬁnal testing). Both pre-testing and ﬁnal testing use correlated

test conditions to cover the speciﬁed temperature and power supply voltage range.

[2]

Typical ratings are not guaranteed. The values listed are at room temperature (25

°C), nominal supply voltages.

[3]

Bus capacitance Cb in pF, from 10 pF to 400 pF.

9.3 Dynamic characteristics: SPI

[1]

All parameters are guaranteed over the virtual junction temperature range by design. Pre-testing is performed at Tamb =85 °C ambient

temperature on wafer level. Cased products are tested at Tamb =25 °C (ﬁnal testing). Both pre-testing and ﬁnal testing use correlated

test conditions to cover the speciﬁed temperature and power supply voltage range.

Table 36.

Dynamic characteristic: I2C-bus pins

VDD(CORE) =VDD(OSC_PLL); VDD(IO) = 2.7 V to 3.6 V; VDDA(ADC3V3) = 3.0 V to 3.6 V; all voltages are measured with respect to

ground; positive currents ﬂow into the IC; unless otherwise speciﬁed[1]

Symbol

Parameter

Conditions

Min

Typ[2]

Max

Unit

tf(o)

output fall time

VIH to VIL

20 + 0.1

× C

[3]

--ns

Table 37.

Dynamic characteristics of SPI pins

VDD(CORE) =VDD(OSC_PLL) ; VDD(IO) = 2.7 V to 3.6 V; VDDA(ADC3V3) = 3.0 V to 3.6 V; VDDA(ADC5V0) = 3.0 V to 5.5 V;

Tvj = -40 °Cto+85 °C; all voltages are measured with respect to ground; positive currents ﬂow into the IC; unless otherwise

speciﬁed.[1]

Symbol

Parameter

Conditions

Min

Typ

Max

Unit

fSPI

SPI operating frequency

master operation

⁄65024fclk(SPI)

⁄2fclk(SPI) MHz

slave operation

⁄65024fclk(SPI)

⁄4fclk(SPI) MHz

tsu(SPI_MISO)

SPI_MISO set-up time

Tamb = 25 °C;

measured in SPI

Master mode;

see Figure 26

-11

Fig 26. SPI data input set-up time in SSP Master mode

tsu(SPI_MISO)

SCKn

shifting edges

SDOn

SDIn

002aae695

sampling edges

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