LPC2917SLASH01 datasheet(69/86 Pages) NXP

69 / 86 page

LPC2917_19_01_2

Preliminary data sheet

Rev. 02 — 17 June 2009

69 of 86

NXP Semiconductors

LPC2917/01; LPC2919/01

ARM9 microcontroller with CAN and LIN

[1]

All parameters are guaranteed over the virtual junction temperature range by design. Pre-testing is performed at Tamb =85 °C ambient

temperature on wafer level. Cased products are tested at Tamb =25 °C (ﬁnal testing). Both pre-testing and ﬁnal testing use correlated

test conditions to cover the speciﬁed temperature and power supply voltage range.

[2]

See Table 26.

[3]

This parameter is not part of production testing or ﬁnal testing, hence only a typical value is stated.

[4]

Oscillator start-up time depends on the quality of the crystal. For most crystals it takes about 1000 clock pulses until the clock is fully

stable.

Jitter speciﬁcation for CAN

tjit(cc)(p-p)

cycle to cycle jitter

(peak-to-peak value)

on CAN TXDC pin

[3] -

0.4

Table 35.

Dynamic characteristics …continued

VDD(CORE) =VDD(OSC_PLL); VDD(IO) = 2.7 V to 3.6 V; VDDA(ADC3V3) = 3.0 V to 3.6 V; all voltages are measured with respect to

ground; positive currents ﬂow into the IC; unless otherwise speciﬁed.[1]

Symbol

Parameter

Conditions

Min

Typ

Max

Unit

Fig 25. Low-power ring oscillator thermal characteristics

temperature (

°C)

−40

−15

002aae373

500

490

510

520

fref(RO)

(kHz)

480

1.9 V

1.8 V

1.7 V

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