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DP83867CSRGZR.B датащи(PDF) 37 Page - Texas Instruments

номер детали DP83867CSRGZR.B
подробное описание детали  DP83867E/IS/CS Robust, High Immunity, Small Form Factor 10/100/1000 Ethernet Physical Layer Transceiver
PDF  129 Pages
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производитель  TI2 [Texas Instruments]
домашняя страница  https://www.ti.com
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DP83867CSRGZR.B датащи(HTML) 37 Page - Texas Instruments

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MDI MODE
MIRROR PORT CONFIGURATION
MDI or MDIX
A → D
B → C
C → B
D → A
Mirror mode can be enabled through strap or through register configuration using the Port Mirror Enable bit in
the CFG4 register (address 0x0031). In Mirror mode, the polarity of the signals is also reversed.
7.4.6.6 Interrupt
The DP83867 can be configured to generate an interrupt when changes of internal status occur. The interrupt
allows a MAC to act upon the status in the PHY without polling the PHY registers. The interrupt source can be
selected through the interrupt registers, MICR (register address 0x0012) and ISR (register address 0x0013).
7.4.6.7 IEEE 802.3 Test Modes
IEEE 802.3 specification for 1000BASE-T requires that the PHY layer be able to generate certain well defined
test patterns on TX outputs. Clause 40 section 40.6.1.1.2 Test Modes describes these tests in detail. There are
four test modes as well as the normal operation mode. These modes can be selected by writing to the CFG1
register (address 0x0009).
See IEEE 802.3 section 40.6.1.1.2 Test modes for more information on the nature of the test modes. The
DP83867 provides a test clock synchronous to the IEEE test patterns. The test patterns are output on the MDI
pins of the device and the transmit clock is output on the CLK_OUT pin.
For more information about configuring the DP83867 for IEEE 802.3 compliance testing, see the How to
Configure DP838XX for Ethernet Compliance Testing application report (SNLS239).
www.ti.com
DP83867CS, DP83867IS, DP83867E
SNLS504F – OCTOBER 2015 – REVISED JANUARY 2025
Copyright © 2025 Texas Instruments Incorporated
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Product Folder Links: DP83867CS DP83867IS DP83867E



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