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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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IMX35 датащи(PDF) 53 Page - Freescale Semiconductor, Inc |
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IMX35 датащи(HTML) 53 Page - Freescale Semiconductor, Inc |
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53 / 148 page  i.MX35 Applications Processors for Industrial and Consumer Products, Rev. 6 Freescale Semiconductor 53 Table 38. DDR Single-ended Slew Rate NOTE SDR SDRAM CLK parameters are measured from the 50% point—that is, “high” is defined as 50% of signal value and “low” is defined as 50% of signal value. DDR SDRAM CLK parameters are measured at the crossing point of SDCLK and SDCLK (inverted clock). Test conditions are: Capacitance 15 pF for DDR PADS. Recommended drive strength is Medium for SDCLK and High for Address and controls. Figure 34. DDR2 SDRAM DQ vs. DQS and SDCLK READ Cycle Timing Diagram SDCLK SDCLK_B DQS (input) DQ (input) DATA DATA DATA DATA DATA DATA DATA DATA DDR26 DDR24 DDR25 |
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