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LPC2921 датащи(PDF) 69 Page - NXP Semiconductors

номер детали LPC2921
подробное описание детали  ARM9 microcontroller with CAN, LIN, and USB
PDF  83 Pages
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производитель  NXP [NXP Semiconductors]
домашняя страница  http://www.nxp.com
Logo NXP - NXP Semiconductors

LPC2921 датащи(HTML) 69 Page - NXP Semiconductors

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LPC2921_23_25_1
© NXP B.V. 2009. All rights reserved.
Preliminary data sheet
Rev. 01 — 15 June 2009
69 of 83
NXP Semiconductors
LPC2921/2923/2925
ARM9 microcontroller with CAN, LIN, and USB
9.5 Dynamic characteristics: flash memory and EEPROM
[1]
Number of program/erase cycles.
Table 37.
Flash characteristics
Tamb = −40 °C to +85 °C; VDD(CORE) =VDD(OSC_PLL); VDD(IO) = 2.7 V to 3.6 V;
VDDA(ADC3V3) = 3.0 V to 3.6 V; all voltages are measured with respect to ground.
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
Nendu
endurance
[1] 10000
-
-
cycles
tret
retention time
powered
10
-
-
years
unpowered
20
-
-
years
tprog
programming time
word
0.95
1
1.05
ms
ter
erase time
global
95
100
105
ms
sector
95
100
105
ms
tinit
initialization time
-
-
150
µs
twr(pg)
page write time
0.95
1
1.05
ms
tfl(BIST)
flash word BIST time
-
38
70
ns
ta(clk)
clock access time
-
-
63.4
ns
ta(A)
address access time
-
-
60.3
ns
Table 38.
EEPROM characteristics
Tamb = −40 °C to +85 °C; VDD(CORE) =VDD(OSC_PLL); VDD(IO) = 2.7 V to 3.6 V;
VDDA(ADC3V3) = 3.0 V to 3.6 V; all voltages are measured with respect to ground.
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
fclk
clock frequency
200
375
400
kHz
Nendu
endurance
100000
500000
-
cycles
tret
retention time
powered
10
-
-
years



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