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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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LPC2921 датащи(PDF) 67 Page - NXP Semiconductors |
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LPC2921 датащи(HTML) 67 Page - NXP Semiconductors |
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67 / 83 page  LPC2921_23_25_1 © NXP B.V. 2009. All rights reserved. Preliminary data sheet Rev. 01 — 15 June 2009 67 of 83 NXP Semiconductors LPC2921/2923/2925 ARM9 microcontroller with CAN, LIN, and USB 9.3 Dynamic characteristics: I2C-bus interface [1] All parameters are guaranteed over the virtual junction temperature range by design. Pre-testing is performed at Tamb =85 °C ambient temperature on wafer level. Cased products are tested at Tamb =25 °C (final testing). Both pre-testing and final testing use correlated test conditions to cover the specified temperature and power supply voltage range. [2] Typical ratings are not guaranteed. The values listed are at room temperature (25 °C), nominal supply voltages. [3] Bus capacitance Cb in pF, from 10 pF to 400 pF. Table 35. Dynamic characteristic: I2C-bus pins VDD(CORE) =VDD(OSC_PLL); VDD(IO) = 2.7 V to 3.6 V; VDDA(ADC3V3) = 3.0 V to 3.6 V; all voltages are measured with respect to ground; positive currents flow into the IC; unless otherwise specified[1] Symbol Parameter Conditions Min Typ[2] Max Unit tf(o) output fall time VIH to VIL 20 + 0.1 × C b [3] --ns |
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