STM32H533CE datasheet(127/231 Pages) STMICROELECTRONICS

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DS14539 Rev 1

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STM32H533xx

Electrical characteristics

200

5.3.11

EMC characteristics

Susceptibility tests are performed on a sample basis during device characterization.

Functional EMS (electromagnetic susceptibility)

While a simple application is executed (toggling two LEDs through I/O ports), the device is

stressed by two electromagnetic events until a failure occurs. The failure is indicated by the

LEDs:

•

Electrostatic discharge (ESD), positive and negative, is applied to all device pins until

a functional disturbance occurs. This test is compliant with the IEC 61000-4-2 standard.

•

FTB: A burst of fast transient voltage (positive and negative) is applied to VDD and VSS

through a 100 pF capacitor, until a functional disturbance occurs. This test is compliant

with the IEC 61000-4-4 standard.

A device reset allows to resume normal operation.

The test results are given in Table 52. They are based on the EMS levels and classes

defined in AN1709 “EMC design guide for STM8, STM32 and legacy MCUs”.

2. Data is evaluated with a write of 50% of the programmed bits equal to 0.

Table 50. Flash memory programming(1)

1. Data are valid for program memory and high-cycling data memory.

Symbol

Parameter

Conditions

Min(2)

2. Specified by design - Not tested in production.

Typ

Max(2)

Unit

tprog

Word program time

128 bits (user area)

100

µs

16 bits (OTP area)

100

tERASE

Sector erase time (8 Kbytes)

tME

Mass erase time

0.52

2.6

Vprog

Programming voltage

1.71

3.6

Table 51. Flash memory endurance and data retention

Symbol

Parameter

Conditions

Min(1)

Unit

NPEND Endurance program memory

TJ = -40 to +130 °C

kcycles

NDEND Endurance data memory

TJ = -40 to +130 °C

100

tPRET

Program memory, data retention

1 kcycle at TA = 125 °C

Years

1 kcycles at TA = 85 °C

10 kcycles at TA = 55 °C

tDRET

Data retention for data memory

100 kcycle at TA = 125 °C

100 kcycles at TA = 85 °C

100 kcycles at TA = 55 °C

1. Evaluated by characterization - Not tested in production, unless otherwise specified.

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