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STM32H533CE датащи(PDF) 130 Page - STMicroelectronics

номер детали STM32H533CE
подробное описание детали  Arm® Cortex®-M33 32-bit MCUTrustZone® FPU, 375 DMIPS 250 MHz, 512-Kbyte flash, 272-Kbyte RAM, cryptography
PDF  231 Pages
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производитель  STMICROELECTRONICS [STMicroelectronics]
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STM32H533CE датащи(HTML) 130 Page - STMicroelectronics

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Electrical characteristics
STM32H533xx
130/231
DS14539 Rev 1
5.3.13
I/O current injection characteristics
As a general rule, avoid current injection to the I/O pins, due to external voltage below VSS
or above VDD (for standard, 3.3 V-capable I/O pins) during the normal product operation. To
give an indication of the device robustness when an abnormal injection accidentally
happens, susceptibility tests are performed on a sample basis during the characterization.
Functional susceptibility to I/O current injection
While a simple application is executed, the device is stressed by injecting current into the
I/O pins (one at the time) programmed in floating input mode, and checked for functional
failures. The failure is indicated by an out of range parameter: ADC error above a certain
limit (higher than 5 LSB TUE), out of conventional limits (-5 / +0 µA range) of induced
leakage current on adjacent pins, or other functional failures (such as reset, oscillator
frequency deviation).
Table 56 shows I/Os current injection susceptibility data. Negative/positive induced leakage
currents are caused, respectively, by negative/positive injection.
5.3.14
I/O port characteristics
General input/output characteristics
Unless otherwise specified, the parameters given in Table 57 are derived from tests
performed under the conditions summarized in Table 20. All I/Os are CMOS and TTL
compliant (except for BOOT0).
Note:
For information on GPIO configuration, refer to AN4899 “STM32 GPIO configuration for
hardware settings and low-power consumption”, available on www.st.com.
Table 55. Electrical sensitivities
Symbol
Parameter
Conditions
Class
LU
Static latchup class
TJ = 130 °C, conforming to JESD78
II level A
Table 56. I/O current injection susceptibility(1)
1. Evaluated by characterization - Not tested in production.
Symbol
Description
Functional susceptibility
Unit
Negative
injection
Positive
injection
IINJ
Injected current on pins PC14, PC15, PB6, PB8,
PE8
00
mA
Injected current on PB5, PB8, PC5, PD10, PE4,
PF6, PH1
50
Injected current on PA4, PA5, PB2, PD8
0
N/A
Injected current on all other pins
5
N/A



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