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P5021 датащи(PDF) 116 Page - NXP Semiconductors |
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P5021 датащи(HTML) 116 Page - NXP Semiconductors |
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116 / 155 page ![]() P5021 QorIQ Integrated Processor Data Sheet, Rev. 1 Electrical characteristics Freescale Semiconductor 116 2.20.5.2.1 AC requirements for XAUI SD_REF_CLKn and SD_REF_CLKn This table specifies AC requirements for SD_REF_CLKn and SD_REF_CLKn, where n = [2:3]. Only SerDes banks 2–3 may be used for various SerDes XAUI configurations based on the RCW Configuration field SRDS_PRTCL. XAUI is not supported on SerDes bank 1. 2.20.5.2.2 XAUI transmitter AC timing specifications This table defines the XAUI transmitter AC timing specifications. RefClk jitter is not included. Table 72. XAUI AC SD_REF_CLKn and SD_REF_CLKn input clock requirements (SVDD = 1.0 V) For recommended operating conditions, see Table 3. Parameter Symbol Min Typ Max Unit Notes SD_REF_CLK/SD_REF_CLK frequency range tCLK_REF — 125/ 156.25 —MHz — SD_REF_CLK/SD_REF_CLK clock frequency tolerance tCLK_TOL –100 — 100 ppm — SD_REF_CLK/SD_REF_CLK reference clock duty cycle tCLK_DUTY 40 50 60 % 2 SD_REF_CLK/SD_REF_CLK cycle to cycle jitter (period jitter at refClk input) tCLK_CJ — — 100 ps — SD_REF_CLK/SD_REF_CLK total reference clock jitter (peak-to-peak phase jitter at refClk input) tCLK_PJ -50 — 50 ps — SD_REF_CLK/SD_REF_CLK rising/falling edge rate tCLKRR/tCLKFR 1—4 V/ns 1 Differential input high voltage VIH 200 — — mV 2 Differential input low voltage VIL — — –200 mV 2 Rising edge rate (SD_REF_CLKn) to falling edge rate (SD_REF_CLKn) matching Rise-Fall Matching —— 20 % 3, 4 Notes: 1. Measured from –200 mV to +200 mV on the differential waveform (derived from SD_REF_CLKn – SD_REF_CLKn). The signal must be monotonic through the measurement region for rise and fall time. The 400 mV measurement window is centered on the differential zero crossing. See Figure 40. 2. Measurement taken from differential waveform 3. Measurement taken from single-ended waveform 4. Matching applies to rising edge for SD_REF_CLKn and falling edge rate for SD_REF_CLKn. It is measured using a 200 mV window centered on the median cross point where SD_REF_CLKn rising meets SD_REF_CLKn falling. The median cross point is used to calculate the voltage thresholds that the oscilloscope uses for the edge rate calculations. The rise edge rate of SD_REF_CLKn should be compared to the fall edge rate of SD_REF_CLKn, the maximum allowed difference should not exceed 20% of the slowest edge rate. See Figure 41. Table 73. XAUI transmitter AC timing specifications For recommended operating conditions, see Table 3. Parameter Symbol Min Typical Max Unit Notes Deterministic jitter JD — — 0.17 UI p-p — Total jitter JT — — 0.35 UI p-p — Unit Interval: 3.125 GBaud UI 320 – 100 ppm 320 320 + 100 ppm ps — |
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