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P5021 датащи(PDF) 116 Page - NXP Semiconductors

номер детали P5021
подробное описание детали  P5021 QorIQ Integrated Processor Data Sheet
PDF  155 Pages
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производитель  NXP [NXP Semiconductors]
домашняя страница  http://www.nxp.com
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P5021 QorIQ Integrated Processor Data Sheet, Rev. 1
Electrical characteristics
Freescale Semiconductor
116
2.20.5.2.1
AC requirements for XAUI SD_REF_CLKn and SD_REF_CLKn
This table specifies AC requirements for SD_REF_CLKn and SD_REF_CLKn, where n = [2:3]. Only SerDes banks 2–3 may
be used for various SerDes XAUI configurations based on the RCW Configuration field SRDS_PRTCL. XAUI is not supported
on SerDes bank 1.
2.20.5.2.2
XAUI transmitter AC timing specifications
This table defines the XAUI transmitter AC timing specifications. RefClk jitter is not included.
Table 72. XAUI AC SD_REF_CLKn and SD_REF_CLKn input clock requirements (SVDD = 1.0 V)
For recommended operating conditions, see Table 3.
Parameter
Symbol
Min
Typ
Max
Unit
Notes
SD_REF_CLK/SD_REF_CLK frequency range
tCLK_REF
—
125/
156.25
—MHz
—
SD_REF_CLK/SD_REF_CLK clock frequency
tolerance
tCLK_TOL
–100
—
100
ppm
—
SD_REF_CLK/SD_REF_CLK reference clock duty
cycle
tCLK_DUTY
40
50
60
%
2
SD_REF_CLK/SD_REF_CLK cycle to cycle jitter
(period jitter at refClk input)
tCLK_CJ
—
—
100
ps
—
SD_REF_CLK/SD_REF_CLK total reference clock
jitter (peak-to-peak phase jitter at refClk input)
tCLK_PJ
-50
—
50
ps
—
SD_REF_CLK/SD_REF_CLK rising/falling edge rate
tCLKRR/tCLKFR
1—4
V/ns
1
Differential input high voltage
VIH
200
—
—
mV
2
Differential input low voltage
VIL
—
—
–200
mV
2
Rising edge rate (SD_REF_CLKn) to falling edge rate
(SD_REF_CLKn) matching
Rise-Fall
Matching
——
20
%
3, 4
Notes:
1. Measured from –200 mV to +200 mV on the differential waveform (derived from SD_REF_CLKn – SD_REF_CLKn). The
signal must be monotonic through the measurement region for rise and fall time. The 400 mV measurement window is
centered on the differential zero crossing. See Figure 40.
2. Measurement taken from differential waveform
3. Measurement taken from single-ended waveform
4. Matching applies to rising edge for SD_REF_CLKn and falling edge rate for SD_REF_CLKn. It is measured using a 200 mV
window centered on the median cross point where SD_REF_CLKn rising meets SD_REF_CLKn falling. The median cross
point is used to calculate the voltage thresholds that the oscilloscope uses for the edge rate calculations. The rise edge rate
of SD_REF_CLKn should be compared to the fall edge rate of SD_REF_CLKn, the maximum allowed difference should not
exceed 20% of the slowest edge rate. See Figure 41.
Table 73. XAUI transmitter AC timing specifications
For recommended operating conditions, see Table 3.
Parameter
Symbol
Min
Typical
Max
Unit
Notes
Deterministic jitter
JD
—
—
0.17
UI p-p
—
Total jitter
JT
—
—
0.35
UI p-p
—
Unit Interval: 3.125 GBaud
UI
320 – 100 ppm
320
320 + 100 ppm
ps
—



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