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P5021 датащи(PDF) 63 Page - NXP Semiconductors

номер детали P5021
подробное описание детали  P5021 QorIQ Integrated Processor Data Sheet
PDF  155 Pages
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производитель  NXP [NXP Semiconductors]
домашняя страница  http://www.nxp.com
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P5021 датащи(HTML) 63 Page - NXP Semiconductors

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Electrical characteristics
P5021 QorIQ Integrated Processor Data Sheet, Rev. 1
Freescale Semiconductor
63
2.6
Input clocks
This section discusses the system clock timing specifications for DC and AC power, spread spectrum sources, real time clock
timing, and dTSEC gigabit Ethernet reference clocks AC timing.
2.6.1
System clock (SYSCLK) timing specifications
This table provides the system clock (SYSCLK) DC specifications.
Junction to board
—
RΘJB
3
°C/W
3
Junction to case top
—
RΘJCtop
0.44
°C/W
4
Junction to lid top
—
RΘJClid
0.17
°C/W
5
Notes:
1. Junction temperature is a function of die size, on-chip power dissipation, package thermal resistance, mounting site (board)
temperature, ambient temperature, air flow, power dissipation of other components on the board, and board thermal
resistance.
2. Junction-to-board thermal resistance determined per JEDEC JESD51-8. Thermal test board meets JEDEC specification for
the specified package.
3. Junction-to-case at the top of the package determined using MIL-STD 883 Method 1012.1. The cold plate temperature is used
for the case temperature. Reported value includes the thermal resistance of the interface layer.
4. Junction-to-Lid-Top thermal resistance determined using the using MIL-STD 883 Method 1012.1. However, instead of the cold
plate, the lid top temperature is used here for the reference case temperature. The reported value does not include the thermal
resistance of the interface layer between the package and cold plate.
5. Junction-to-lid-top thermal resistance determined using the using MIL-STD 883 Method 1012.1. However, instead of the cold
plate, the lid top temperature is used here for the reference case temperature. Reported value does not include the thermal
resistance of the interface layer between the package and cold plate.
6. Reference Section 3.8, “Thermal management information,” for additional details.
Table 11. SYSCLK DC electrical characteristics (OVDD = 3.3 V)
For recommended operating conditions, see Table 3.
Parameter
Symbol
Min
Typical
Max
Unit
Notes
Input high voltage
VIH
2.0
—
—
V
1
Input low voltage
VIL
——
0.8
V
1
Input current (OVIN= 0 V or OVIN =
OVDD)
IIN
——
±40
μA2
Notes:
1. The min VILand max VIH values are based on the respective min and max OVIN values found in Table 3.
2. The symbol OVIN, in this case, represents the OVIN symbol referenced in Section 2.1.2, “Recommended operating conditions.”
Table 10. Package thermal characteristics (continued)6
Rating
Board
Symbol
Value
Unit
Notes



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