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MPC8313E датащи(PDF) 74 Page - Freescale Semiconductor, Inc |
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MPC8313E датащи(HTML) 74 Page - Freescale Semiconductor, Inc |
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74 / 92 page ![]() MPC8313E PowerQUICC™ II Pro Processor Hardware Specifications, Rev. 1 74 Freescale Semiconductor Thermal 20.1 Thermal Characteristics Table 67 provides the package thermal characteristics for the 516 27 × 27 mm TEPBGAII. Table 67. Package Thermal Characteristics for TEPBGAII Characteristic Board type Symbol TEPBGAII Unit Notes Junction to Ambient Natural Convection Single layer board (1s) RθJA 25 °C/W 1,2 Junction to Ambient Natural Convection Four layer board (2s2p) RθJA 18 °C/W 1,2,3 Junction to Ambient (@200 ft/min) Single layer board (1s) RθJMA 20 °C/W 1,3 Junction to Ambient (@200 ft/min) Four layer board (2s2p) RθJMA 15 °C/W 1,3 Junction to Board — RθJB 10 °C/W 4 Junction to Case — RθJC 8°C/W 5 Junction to Package Top Natural Convection Ψ JT 7°C/W 6 Notes: 1. Junction temperature is a function of die size, on-chip power dissipation, package thermal resistance, mounting site (board) temperature, ambient temperature, air flow, power dissipation of other components on the board, and board thermal resistance. 2. Per JEDEC JESD51-2 with the single layer board horizontal. Board meets JESD51-9 specification. 3. Per JEDEC JESD51-6 with the board horizontal. 4. Thermal resistance between the die and the printed circuit board per JEDEC JESD51-8. Board temperature is measured on the top surface of the board near the package. 5. Thermal resistance between the die and the case top surface as measured by the cold plate method (MIL SPEC-883 Method 1012.1). 6. Thermal characterization parameter indicating the temperature difference between package top and the junction temperature per JEDEC JESD51-2. When Greek letters are not available, the thermal characterization parameter is written as Psi-JT. |
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