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TMP93CS41 датащи(PDF) 153 Page - Toshiba Semiconductor |
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TMP93CS41 датащи(HTML) 153 Page - Toshiba Semiconductor |
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153 / 248 page ![]() TMP93CS40/TMP93CS41 2004-02-10 93CS40-151 3. Pulse width measurement This mode allows measurement of the H level width of an external pulse. While keeping the 16-bit timer/event counter counting (Free running) with the internal clock input, the external pulse is input via the TI4 pin. Then the capture function is used to load the UC4 values into CAP1 and CAP2 on the rising edge and falling edge of the external trigger pulse respectively. The interrupt INT4 occurs at the falling edge of TI4. The pulse width is obtained from the difference between the values of CAP1 and CAP2 and the internal clock cycle. For example, if the internal clock is 0.8 µs and the difference between CAP1 and CAP2 is 100, the pulse width will be 100 × 0.8 µs = 80 µs. Figure 3.9.18 Pulse Width Measurement Note: External interrupt INT4 occurs at the falling edge of the TI4 pin input only in this pulse width measuring mode (T4MOD<CAP12M1:0> = 10). In other modes, it occurs at the rising edge. The width of the L level can be measured from the difference between the first C2 and the second C1 at the second INT4 interrupt. 4. Time difference measurement This mode is used to measure the difference in time between the rising edges of external pulses input via TI4 and TI5. While keeping the 16-bit timer/event counter (Timer 4) counting (Free running) with the internal clock, the UC4 value is loaded into CAP1 on the rising edge of the input pulse to TI4. Then the interrupt INT4 is generated. Similarly, the UC4 value is loaded into CAP2 on the rising edge of the input pulse to TI5, generating the interrupt INT5. The time difference between these pulses can be obtained from the difference between the time counts at which loading the up counter value into CAP1 and CAP2 was performed. C1 Count clock (Internal clock) TI4 pin (External pulse) Loading UC4 into CAP1 Loading UC4 into CAP2 INT4 C2 C1 C1 C2 C2 |
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