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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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TMS570LS1114 датащи(PDF) 35 Page - Texas Instruments |
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TMS570LS1114 датащи(HTML) 35 Page - Texas Instruments |
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35 / 169 page  TMS570LS1114 www.ti.com SPNS188B – OCTOBER 2012 – REVISED FEBRUARY 2015 4.3.2.16 Test and Debug Modules Interface Table 4-35. ZWT Test and Debug Modules Interface Terminal Signal Reset Pull Pull Type Description Type State Signal Name 337 ZWT TEST U2 Input Pull Down Fixed 100 µA Test enable. This terminal Pull Down must be connected to ground directly or via a pull-down resistor. nTRST D18 Input JTAG test hardware reset RTCK A16 Output N/A None JTAG return test clock TCK B18 Input Pull Down Fixed 100 µA JTAG test clock Pull Down TDI A17 Input Pull Up Fixed 100 µA JTAG test data in Pull Up TDO C18 Output 100 µA None JTAG test data out Pull Down TMS C19 Input Pull Up Fixed 100 µA JTAG test select Pull Up 4.3.2.17 Flash Supply and Test Pads Table 4-36. ZWT Flash Supply and Test Pads Terminal Signal Reset Pull Pull Type Description Type State Signal Name 337 ZWT VCCP F8 3.3V N/A None Flash pump supply Power FLTP1 J5 - N/A None Flash test pads. These terminals are reserved for FLTP2 H5 TI use only. For proper operation these terminals must connect only to a test pad or not be connected at all [no connect (NC)]. 4.3.2.18 Reserved Table 4-37. Reserved Terminal Signal Reset Pull Pull Type Description Type State Signal Name 337 ZWT Reserved A15 - N/A None Reserved. These balls are connected to internal logic Reserved B15 - N/A None but are not outputs nor do Reserved B16 - N/A None they have internal pulls. They are subject to ±1 µA Reserved A8 - N/A- None leakage current. Reserved B8 - N/A None Reserved B9 - N/A None Copyright © 2012–2015, Texas Instruments Incorporated Terminal Configuration and Functions 35 Submit Documentation Feedback Product Folder Links: TMS570LS1114 |
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