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ADS58C48IPFPR датащи(PDF) 5 Page - Texas Instruments

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номер детали ADS58C48IPFPR
подробное описание детали  Quad Channel IF Receiver with SNRBoost 3G
PDF  70 Pages
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производитель  TI [Texas Instruments]
домашняя страница  http://www.ti.com
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ADS58C48IPFPR датащи(HTML) 5 Page - Texas Instruments

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ADS58C48
www.ti.com
SLAS689 – MAY 2010
ELECTRICAL CHARACTERISTICS
Typical values are at 25°C, AVDD = 1.8 V, DRVDD = 1.8 V, sampling frequency = 200 MSPS, 50% clock duty cycle, –1
dBFS differential analog input, LVDS and CMOS interfaces unless otherwise noted.
MIN and MAX values are across the full temperature range TMIN = –40°C to TMAX = 85°C, AVDD = 1.8 V, DRVDD = 1.8 V
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Resolution
11
bits
ANALOG INPUTS
Differential input voltage range
2
Vpp
Differential input resistance (at 200 MHz, see
0.75
k
Ω
Figure 52)
Differential input capacitance (at 200 MHz, see
3.7
pF
Figure 53)
Analog input bandwidth
550
MHz
Analog input common mode current (per input pin
0.8
µA/MSPS
of each channel)
VCM common mode voltage output
0.95
V
VCM output current capability
4
mA
POWER SUPPLY
IAVDD
Analog supply current
290
330
mA
IDRVDD
350-mV LVDS swing with 100-
Ω
Output buffer supply current LVDS interface
207
230
mA
external termination after reset.
Analog power
522
mW
Digital power LVDS interface
373
mW
Global power down
30
mW
ELECTRICAL CHARACTERISTICS
Typical values are at 25°C, AVDD = 1.8 V, DRVDD = 1.8 V, sampling frequency = 200 MSPS, 50% clock duty cycle, –1
dBFS differential analog input, LVDS and CMOS interfaces unless otherwise noted.
MIN and MAX values are across the full temperature range TMIN = –40°C to TMAX = 85°C, AVDD = 1.8 V, DRVDD = 1.8 V
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
DC ACCURACY
DNL
Differential non-linearity
Fin = 170 MHz
–0.9
1.2
LSB
INL
Integral non-linearity
Fin = 170 MHz
–2.0
±1.0
2.0
LSB
Specified across devices and across channels
Offset error
–25
25
mV
within a device
There are two sources of gain error – internal reference inaccuracy and channel gain error
Gain error due to internal reference
Specified across devices and across channels
–2.5
2.5
%FS
inaccuracy alone
within a device
Specified across devices and across channels
Gain error of channel alone(1)
–0.1% –1.0%
within a device
Channel gain error temperature
0.001
Δ%/°C
coefficient
(1)
This is specified by design and characterization; it is not tested in production.
Copyright © 2010, Texas Instruments Incorporated
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