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ADBMS2950BCCSZ датащи(PDF) 32 Page - Analog Devices |
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ADBMS2950BCCSZ датащи(HTML) 32 Page - Analog Devices |
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32 / 97 page ![]() ADBMS2950B Data Sheet Rev. 0 | Page 32 of 97 The IxCAL bits are low until the initialization process has completed, after 136 conversions. The total time required for initialization = tIxADC_STARTUP + tIxADC_INIT. When initialization is started by an ADV or ADX command, no IxADC results are available, and IxCNT remains zero. For this reason, it is recommended to start the initialization through a continuous ADIx command and wait for 136 conversion cycles (when IxCNT reports 136 the first time) before reading the IxADC results for the first time. From power-up or SRST, it takes tWAKE + tREFUP + tIxADC_STARTUP + tIxADC_INIT for the IxADCs to meet the accuracy specification. The VBxADC results are available during the initialization process. All other ADCs are unaffected by the initialization process. IxADC Open-Wire Current Sources As shown in Figure 1, the ADBMS2950B features current sources at the inputs of both current measurement channels. Activating these current sources allows the detection of a broken connection to a shunt resistor. The Open-wire current sources are configured by the DIAGSEL configuration register and activated by issuing a diagnostic ADI1 or ADI2 measurement through the OPT command bits. The current sources have a value of about 0.5 μA. As the open-wire current sources are connected after a 3.8 kΩ ESD protection resistor, activating them changes the reading of the corresponding IxADC by about 1.9 mV, while it does not affect the reading of the other IxADC. It also does not affect any of the OCxADC readings. Redundant I2ADC and VB2ADC diagnostic measurements (synchronous to I1ADC and VB1ADC for redundancy) must be terminated through one of the two ADI2 single-shot measurement (non-diagnostic) or any other ADI2 single-shot diagnostic (DIAGSEL) measurement command after DIAGSEL has been set to 0b000. Battery Voltage Measurements The ADBMS2950B features two dedicated battery-stack voltage measurement paths that connect to one or two external resistor- dividers through the VBAT1 and VBAT2 pins. The voltage at these pins is first buffered to provide a high input resistance and then applied to two 16-bit ADCs. VB1ADC operates simultaneously and synchronously to I1ADC whenever an ADI1 command is issued. Diagnostic measurements selected through DIAGSEL and activated through OPT command bits are also performed on both ADCs simultaneously. The same is valid for VB2ADC, which operates simultaneously and synchronously to I2ADC. If ADI1 is issued with the RD command bit set, all four ADCs operate synchronously, irrespective of whether the OPT bits are set to single-shot or continuous mode. Redundant I2ADC and VB2ADC diagnostic measurements (synchronous to I1ADC and VB1ADC for redundancy) must be terminated through one of the two ADI2 single-shot measurement (non-diagnostic) or any other ADI2 single-shot diagnostic (DIAGSEL) measurement command after DIAGSEL has been set to 0b000. VBxADC Open-Wire Current Sources Similar to the IxADCs, the VBxADCs feature current sources connected to their inputs. The open-wire current source has a value of 10 μA and is preceded by a 2.3 kΩ ESD protection resistor, leading to a typical change in ADC output of about 23 mV. Continuous or Single-Shot Measurements The IxADC and VBxADC can be configured to perform a single measurement or continuous measurements, which are controlled by the OPT command bits. In continuous mode, the result registers of the corresponding ADCs are updated at their conversion rate (nominally 1 ms for the Ix, VBx registers, and 1 ms times ACCN for the accumulated result registers IxACC, VBxACC) for non-diagnostic measurements. For diagnostic measurements, the content of the accumulated IxADC result registers is not valid and must be ignored and only the 1 ms conversion results must be used. The accumulated VBxADC result registers can be used for diagnostic and non-diagnostic measurements. To end the continuous measurement mode of the respective ADCs, a single-shot ADI1 or ADI2 command must be sent. The addressed ADCs then perform the last single-shot measurement and stop. Conversion Results Accumulation In the continuous diagnostic measurement mode, the VBxADC conversions are summed up to the accumulation results VBxACC. The current measurement accumulation results IxACC are not valid during diagnostic operation. In continuous non-diagnostic measurement mode, the IxADC and VBxADC results are summed up to the accumulation results IxACC and VBxACC. The ACCI (and the resulting ACCN) register configures the number of IxADC and VBxADC conversions (ACCN) that are accumulated internally before being stored to the IxACC and VBxACC registers. The ACCI configuration becomes active only with the next ADI1 or ADI2 command. The internal accumulators are cleared to start a new cycle after the accumulation result registers have been updated. The update rate of those registers thus depends on ACCN, which can be set to be slower than the host controller update rate, allowing to read back-to-back conversion results. The conversion counters I1CNT and I2CNT allow to identify new conversions and discard those that are already read. |
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