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A3P030 датащи(PDF) 122 Page - Microsemi Corporation |
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A3P030 датащи(HTML) 122 Page - Microsemi Corporation |
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122 / 220 page ![]() ProASIC3 DC and Switching Characteristics 2-108 Revision 13 JTAG 1532 Characteristics JTAG timing delays do not include JTAG I/Os. To obtain complete JTAG timing, add I/O buffer delays to the corresponding standard selected; refer to the I/O timing characteristics in the "User I/O Characteristics" section on page 2-14 for more details. Timing Characteristics Table 2-125 • JTAG 1532 Commercial-Case Conditions: TJ = 70°C, Worst-Case VCC = 1.425 V Parameter Description –2 –1 Std. Units tDISU Test Data Input Setup Time 0.50 0.57 0.67 ns tDIHD Test Data Input Hold Time 1.00 1.13 1.33 ns tTMSSU Test Mode Select Setup Time 0.50 0.57 0.67 ns tTMDHD Test Mode Select Hold Time 1.00 1.13 1.33 ns tTCK2Q Clock to Q (data out) 6.00 6.80 8.00 ns tRSTB2Q Reset to Q (data out) 20.00 22.67 26.67 ns FTCKMAX TCK Maximum Frequency 25.00 22.00 19.00 MHz tTRSTREM ResetB Removal Time 0.00 0.00 0.00 ns tTRSTREC ResetB Recovery Time 0.20 0.23 0.27 ns tTRSTMPW ResetB Minimum Pulse TBD TBD TBD ns Note: For specific junction temperature and voltage supply levels, refer to Table 2-6 on page 2-6 for derating values. |
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