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A3P030 датащи(PDF) 73 Page - Microsemi Corporation |
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A3P030 датащи(HTML) 73 Page - Microsemi Corporation |
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73 / 220 page ![]() ProASIC3 Flash Family FPGAs Revision 13 2-59 Table 2-77 • Minimum and Maximum DC Input and Output Levels Applicable to Standard Plus I/O Banks 1.5 V LVCMOS VIL VIH VOL VOH IOL IOH IOSL IOSH IIL1 IIH2 Drive Strength Min. V Max. V Min. V Max. V Max. V Min. VmA mA Max. mA3 Max. mA3 µA4 µA4 2 mA –0.3 0.35 * VCCI 0.65 * VCCI 1.575 0.25 * VCCI 0.75 * VCCI 2 2 16 13 10 10 4 mA –0.3 0.35 * VCCI 0.65 * VCCI 1.575 0.25 * VCCI 0.75 * VCCI 4 4 33 25 10 10 Notes: 1. IIL is the input leakage current per I/O pin over recommended operation conditions where –0.3 V < VIN < VIL. 2. IIH is the input leakage current per I/O pin over recommended operating conditions VIH < VIN < VCCI. Input current is larger when operating outside recommended ranges 3. Currents are measured at high temperature (100°C junction temperature) and maximum voltage. 4. Currents are measured at 85°C junction temperature. 5. Software default selection highlighted in gray. Table 2-78 • Minimum and Maximum DC Input and Output Levels Applicable to Standard I/O Banks 1.5 V LVCMOS VIL VIH VOL VOH IOL IOH IOSL IOSH IIL1 IIH2 Drive Strength Min. V Max. V Min. V Max. V Max. V Min. VmA mA Max. mA3 Max. mA3 µA4 µA4 2 mA –0.3 0.35 * VCCI 0.65 * VCCI 3.6 0.25 * VCCI 0.75 * VCCI 2 2 13 16 10 10 Notes: 1. IIL is the input leakage current per I/O pin over recommended operation conditions where –0.3 V < VIN < VIL. 2. IIH is the input leakage current per I/O pin over recommended operating conditions VIH < VIN < VCCI. Input current is larger when operating outside recommended ranges. 3. Currents are measured at high temperature (100°C junction temperature) and maximum voltage. 4. Currents are measured at 85°C junction temperature. 5. Software default selection highlighted in gray. Figure 2-9 • AC Loading Table 2-79 • AC Waveforms, Measuring Points, and Capacitive Loads Input Low (V) Input High (V) Measuring Point* (V) CLOAD (pF) 0 1.5 0.75 35 Note: *Measuring point = Vtrip. See Table 2-22 on page 2-21 for a complete table of trip points. Test Point Test Point Enable Path Datapath 35 pF R = 1 k R to VCCI for tLZ / tZL / tZLS R to GND for tHZ / tZH / tZHS 35 pF for tZH / tZHS / tZL / tZLS 35 pF for tHZ / tLZ |
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