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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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MSP430 датащи(PDF) 12 Page - Texas Instruments |
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MSP430 датащи(HTML) 12 Page - Texas Instruments |
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12 / 96 page  12 MSP430G2533, MSP430G2433, MSP430G2333, MSP430G2233 MSP430G2403, MSP430G2303, MSP430G2203 SLAS734G – APRIL 2011 – REVISED APRIL 2016 www.ti.com Submit Documentation Feedback Product Folder Links: MSP430G2533 MSP430G2433 MSP430G2333 MSP430G2233 MSP430G2403 MSP430G2303 MSP430G2203 Terminal Configuration and Functions Copyright © 2011–2016, Texas Instruments Incorporated Table 4-1. Terminal Functions (continued) TERMINAL I/O DESCRIPTION NAME NO. PW20, N20 PW28 RHB32 TEST/ 17 25 24 I Selects test mode for JTAG pins on Port 1. The device protection fuse is connected to TEST. SBWTCK Spy-Bi-Wire test clock input during programming and test AVCC NA NA 29 NA Analog supply voltage DVCC 1 1 30 NA Digital supply voltage DVSS 20 28 27, 28 NA Ground reference NC NA NA 8, 32 NA Not connected QFN Pad NA NA Pad NA QFN package pad connection to VSS recommended. |
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