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LPC55S2X датащи(PDF) 96 Page - NXP Semiconductors

номер детали LPC55S2X
подробное описание детали  32-bit Arm Cortex®-M33 microcontroller
PDF  132 Pages
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производитель  NXP [NXP Semiconductors]
домашняя страница  http://www.nxp.com
Logo NXP - NXP Semiconductors

LPC55S2X датащи(HTML) 96 Page - NXP Semiconductors

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NXP Semiconductors
LPC55S2x/LPC552x
32-bit Arm Cortex®-M33 microcontroller
Tamb = -40 °C to +105 °C; VDDA = 1.8 V to 3.6 V; ADC calibrated at T = 25 °C.
Symbol
Parameter
Conditions
Min[1]
Typ[1]
Max[1]
Unit
16-bit differential mode,
CTYPE = 2
[3][1][4][5][6] -0.99
-
2.6
LSB
ED
differential
linearity error
16-bit single ended mode,
CTYPE = 1
[3][1][4][5][6] -1
+9.5
LSB
16-bit differential mode,
CTYPE = 2
[3][1][4][5][7] -16
-
+16
LSB
EL(adj)
integral non-
linearity
16-bit single ended mode,
CTYPE = 1
[3][1][4][5][7] -12
-
+12
LSB
EO
offset error
uncalibrated
[3][8] -
2.3
-
mV
Verr(FS)
full-scale error
voltage
uncalibrated
[3][9] -
24
-
LSB
16-bit differential mode,
CTYPE = 2
[10] -
12.6
-
bits
ENOB
[L:] Effective
number of bits
16-bit single ended mode,
CTYPE = 1
[10] -
12.0
-
bits
16-bit differential mode,
CTYPE = 2
[10] -
-85
-
dB
THD
[L:] Total
Harmonic
Distortion
16-bit single ended mode,
CTYPE = 1
[10] -
-85
-
dB
16-bit differential mode,
CTYPE = 2
[10] -
86
-
dB
SFDR
[L:] Spurious Free
Dynamic Range
16-bit single ended mode,
CTYPE = 1
[10] -
82
-
dB
tADCSTUP Analog startup
time
Wait time after setting
ADC_CTRL[ADCEN] [10]
[11] -
5
-
us
Table 41. 16-bit ADC static characteristics...continued
[1]
The values listed are typical values and are not guaranteed. Based on characterization. Not tested in production. If VREFP is less than VDDA, then
voltage inputs greater than VREFP and less than VDDA are allowed but result in a full scale conversion result.
[2]
To use temperature sensor, the maximum fclk(ADC) frequency is 6 MHz.
[3]
Linear data collected using a linear histogram technique.
[4]
fclk(ADC) = 24 MHz, STS = 3, Power select = 1, Average setting = 1, fs = 1 Msample/s
[5]
Differential linear results assume offset 0.2% from VREFL and 0.2% from VREFH
[6]
The differential linearity error (ED) is the difference between the actual step width and the ideal step width.
[7]
The integral non-linearity (EL(adj)) is the peak difference between the center of the steps of the actual and the ideal transfer curve after appropriate
adjustment of gain and offset errors.
[8]
The offset error (EO) is the absolute difference between the straight line which fits the actual curve and the straight line which fits the ideal curve. For best
performance, force the offset calibration to -16. Set this prior to performing the gain calibration.
[9]
The full-scale error voltage or gain error (EG) is the difference between the straight-line fitting the actual transfer curve after removing offset error, and the
straight line which fits the ideal transfer curve.
[10] Input data is 1kHz sine wave, ADC conversion clock 24 MHz, Power Select = 3, Average setting = 4.
[11] Value of ADC_CFG[PUDLY] * 4 * ADCclk must be > tADCSTUP.
12.2.1 ADC input resistance (Please refer to the ADC Inputs Selection & ADC programming
table in the UM)
Tamb = -40 °C to +105 °C
Min
Typ
Max
Unit
RI
Input resistance
Table 42. ADC input resistance
LPC55S2X_LPC552X
All information provided in this document is subject to legal disclaimers.
© 2024 NXP B.V. All rights reserved.
Data sheet
Rev. 2.3 — 29 August 2024
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