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LPC55S2X датащи(PDF) 96 Page - NXP Semiconductors |
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LPC55S2X датащи(HTML) 96 Page - NXP Semiconductors |
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96 / 132 page ![]() NXP Semiconductors LPC55S2x/LPC552x 32-bit Arm Cortex®-M33 microcontroller Tamb = -40 °C to +105 °C; VDDA = 1.8 V to 3.6 V; ADC calibrated at T = 25 °C. Symbol Parameter Conditions Min[1] Typ[1] Max[1] Unit 16-bit differential mode, CTYPE = 2 [3][1][4][5][6] -0.99 - 2.6 LSB ED differential linearity error 16-bit single ended mode, CTYPE = 1 [3][1][4][5][6] -1 +9.5 LSB 16-bit differential mode, CTYPE = 2 [3][1][4][5][7] -16 - +16 LSB EL(adj) integral non- linearity 16-bit single ended mode, CTYPE = 1 [3][1][4][5][7] -12 - +12 LSB EO offset error uncalibrated [3][8] - 2.3 - mV Verr(FS) full-scale error voltage uncalibrated [3][9] - 24 - LSB 16-bit differential mode, CTYPE = 2 [10] - 12.6 - bits ENOB [L:] Effective number of bits 16-bit single ended mode, CTYPE = 1 [10] - 12.0 - bits 16-bit differential mode, CTYPE = 2 [10] - -85 - dB THD [L:] Total Harmonic Distortion 16-bit single ended mode, CTYPE = 1 [10] - -85 - dB 16-bit differential mode, CTYPE = 2 [10] - 86 - dB SFDR [L:] Spurious Free Dynamic Range 16-bit single ended mode, CTYPE = 1 [10] - 82 - dB tADCSTUP Analog startup time Wait time after setting ADC_CTRL[ADCEN] [10] [11] - 5 - us Table 41. 16-bit ADC static characteristics...continued [1] The values listed are typical values and are not guaranteed. Based on characterization. Not tested in production. If VREFP is less than VDDA, then voltage inputs greater than VREFP and less than VDDA are allowed but result in a full scale conversion result. [2] To use temperature sensor, the maximum fclk(ADC) frequency is 6 MHz. [3] Linear data collected using a linear histogram technique. [4] fclk(ADC) = 24 MHz, STS = 3, Power select = 1, Average setting = 1, fs = 1 Msample/s [5] Differential linear results assume offset 0.2% from VREFL and 0.2% from VREFH [6] The differential linearity error (ED) is the difference between the actual step width and the ideal step width. [7] The integral non-linearity (EL(adj)) is the peak difference between the center of the steps of the actual and the ideal transfer curve after appropriate adjustment of gain and offset errors. [8] The offset error (EO) is the absolute difference between the straight line which fits the actual curve and the straight line which fits the ideal curve. For best performance, force the offset calibration to -16. Set this prior to performing the gain calibration. [9] The full-scale error voltage or gain error (EG) is the difference between the straight-line fitting the actual transfer curve after removing offset error, and the straight line which fits the ideal transfer curve. [10] Input data is 1kHz sine wave, ADC conversion clock 24 MHz, Power Select = 3, Average setting = 4. [11] Value of ADC_CFG[PUDLY] * 4 * ADCclk must be > tADCSTUP. 12.2.1 ADC input resistance (Please refer to the ADC Inputs Selection & ADC programming table in the UM) Tamb = -40 °C to +105 °C Min Typ Max Unit RI Input resistance Table 42. ADC input resistance LPC55S2X_LPC552X All information provided in this document is subject to legal disclaimers. © 2024 NXP B.V. All rights reserved. Data sheet Rev. 2.3 — 29 August 2024 Document feedback 96 / 132 |
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