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ADPD6000 датащи(PDF) 27 Page - Analog Devices |
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ADPD6000 датащи(HTML) 27 Page - Analog Devices |
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27 / 89 page ![]() Data Sheet ADPD6000 APPLICATIONS INFORMATION analog.com Rev. 0 | 27 of 89 OPTICAL PATH Digital Integration Mode The ADPD6000 supports a digital integration mode in the optical path to accommodate sensors that require longer pulses. Digital integration mode allows the system to use a larger LED duty cycle, which may result in the highest achievable levels of SNR. Figure 40. Signal Path for Digital Integration Mode In digital integration mode, the integrator is configured as a buffer, resulting in the signal path shown in Figure 40. Digital integration regions are configured by the user and separated into lit and dark regions. The LED is pulsed in the lit region, and the LED is off in the dark region. ADC samples are taken at 1 μs intervals within the lit and dark regions and are then digitally integrated. The integration of the ADC samples from the dark region is subtracted from the integration of the ADC samples from the lit region and the result is written into the relevant FIFO. Both signal and dark values can be written to the FIFO. The ADPD6000 supports one-region and two-region digital integra- tion modes. In one-region digital integration mode, an equal number of dark and lit samples are taken where all of the dark samples are taken in the dark region just prior to the lit region. One-region digital integration mode is shown in the timing diagram in Figure 41. In two-region digital integration mode, an equal number of dark and lit samples are taken. However, the dark region is split such that half of the samples are taken in the dark region prior to the lit region, and the other half is taken in the dark region following the lit region. The two-region digital integration mode results in higher ambient light rejection than the one-region digital integration mode in situations with a varying ambient light level. A timing diagram for two-region digital integration mode is shown in Figure 42. The signal data for one-region digital integration mode that reads from the FIFO follows Equation 4: Signal= IPD×RTIA×TIA_Config×Buf _Gain×NUM_INT_x×NUM_REPEAT_x/ 146μV/LSB (4) where: IPD is the PD current. TIA_Config is the TIA configuration. Buf_Gain is the buffer gain. The signal data for two-region digital integration mode that reads from the FIFO follows Equation 5: Signal= IPD×RTIA×TIA_Config×Buf _Gain×NUM_INT_x×NUM_REPEAT_x/ 146μV/LSB ×2 (5) The AFE_PATH_CFG_x, CHx_TRIM_INT_x, and CHx_TRIM_INT_CAP_x bits need to follow a certain combination in digital integration mode (both one-region mode and two-region mode). Table 13 shows the recommended settings of these bits. The TIA gain setting is independent of these settings. Table 13. Bit Settings for AFE Path in Digital Integration Mode Bit Name Recommended Setting AFE_INT_C_BUF_x 0x0 AFE_PATH_CFG_x 0x28 CHx_TRIM_INT_x 0x3 CHx_TRIM_INT_CAP_x 0x1 The result of the configurations of the bits in Table 13 is 1× TIA configuration with buffer gain = 2. Table 14 shows the relevant register settings for the digital integra- tion modes of operation. The MIN_PERIOD_x bits must be set manually with the proper period because the minimum period is not automatically calculated in digital integration mode. The recommended MIN_PERIOD_x setting for one-region digital integration mode is as follows: MIN_PERIOD_x=NUM_INT_x×2+ 2+tD ×2 The recommended MIN_PERIOD_x setting for two-region digital integration mode is as follows: MIN_PERIOD_x=NUM_INT_x×4+tD×2+6μs The tD value is the response time of the optical device. The 6 μs time is essential for the ambient fine loop update. |
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