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AN4192 датащи(PDF) 35 Page - STMicroelectronics

номер детали AN4192
подробное описание детали  In the latest generation of CPUs for modern desktop and notebook platforms
PDF  47 Pages
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производитель  STMICROELECTRONICS [STMicroelectronics]
домашняя страница  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

AN4192 датащи(HTML) 35 Page - STMicroelectronics

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AN4192
Low-side FET selection
Doc ID 023820 Rev 1
35/47
strongest smoothing effect. Another important phenomenon that affects the LS switching
performance is the LS gate-source spurious oscillations. When the HS turns on, spurious
ringing appears between LS gate and source, caused by high dVphase/dt and the parasitic
effects due to the PCB stray inductances (at all the MOSFET pins).
Figure 42.
Simplified LS FET circuit
To reduce the phase node spike and therefore LS gate-source parasitic fluctuations, the
“filter effect” provided by the MOSFET intrinsic output capacitance (COSS = CGD + CDS) is
important. In fact, COSS works as an “intrinsic” capacitive snubber between drain and
source.
Figure 43.
Single-phase synchronous buck converter schematic
In a single-phase buck converter demonstration board (VIN = 12 V, VOUT = 1.25 V, fSW = 270
kHz, 1 x HS, 1 x LS, IOUT = 20 A, Figure 43), the benefits given by two paralleled 30 V FETs
(doubled Cgs) in terms of LS G-S induced ringing are evaluated. External gate resistances
are connected to HS (2.2
Ω) and LS (2.2 Ω) FETs. An RC snubber network (CSNUB = 6.8 nF,
RSNUB = 1.8 Ω) is used to improve the switching behavior. As shown in Figure 44 (purple
trace: 2 x LS - yellow trace: 1 x LS), the two paralleled LS FETs have smoothed high
frequency LS oscillations, both in the highest and in the lowest spike.
AM16485V1
AM16486V1



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