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PIC32MX795F512LT-80I/PF датащи(PDF) 189 Page - Microchip Technology |
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PIC32MX795F512LT-80I/PF датащи(HTML) 189 Page - Microchip Technology |
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189 / 256 page ![]() © 2009-2011 Microchip Technology Inc. DS61156G-page 189 PIC32MX5XX/6XX/7XX TABLE 31-8: DC CHARACTERISTICS: I/O PIN INPUT SPECIFICATIONS DC CHARACTERISTICS Standard Operating Conditions: 2.3V to 3.6V (unless otherwise stated) Operating temperature -40°C ≤TA ≤+85°C for Industrial -40°C ≤TA ≤+105°C for V-Temp Param. No. Symbol Characteristics Min. Typical(1 ) Max. Units Conditions VIL Input Low Voltage DI10 I/O Pins: with TTL Buffer VSS —0.15 VDD V with Schmitt Trigger Buffer VSS —0.2 VDD V DI15 MCLR(2) VSS —0.2 VDD V DI16 OSC1 (XT mode) VSS —0.2 VDD V (Note 4) DI17 OSC1 (HS mode) VSS —0.2 VDD V (Note 4) DI18 SDAx, SCLx VSS —0.3 VDD V SMBus disabled (Note 4) DI19 SDAx, SCLx VSS — 0.8 V SMBus enabled (Note 4) VIH Input High Voltage DI20 I/O Pins: with Analog Functions 0.8 VDD —VDD V (Note 4) Digital Only 0.8 VDD —V with TTL Buffer 0.25 VDD + 0.8V — 5.5 V (Note 4) with Schmitt Trigger Buffer 0.8 VDD —5.5 V DI25 MCLR(2) 0.8 VDD —VDD V DI26 OSC1 (XT mode) 0.7 VDD —VDD V (Note 4) DI27 OSC1 (HS mode) 0.7 VDD —VDD V (Note 4) DI28 SDAx, SCLx 0.7 VDD — 5.5 V SMBus disabled (Note 4) DI29 SDAx, SCLx 2.1 — 5.5 V SMBus enabled, 2.3V ≤VPIN ≤5.5 (Note 4) DI30 ICNPU CNxx Pull up Current 50 250 400 μAVDD = 3.3V, VPIN = VSS IIL Input Leakage Current(3) DI50 I/O Ports — — +1 μAVSS ≤VPIN ≤VDD, Pin at high-impedance DI51 Analog Input Pins — — +1 μAVSS ≤VPIN ≤VDD, Pin at high-impedance DI55 MCLR(2) —— +1 μAVSS ≤VPIN ≤VDD DI56 OSC1 — — +1 μAVSS ≤VPIN ≤VDD, XT and HS modes Note 1: Data in “Typical” column is at 3.3V, 25°C unless otherwise stated. Parameters are for design guidance only and are not tested. 2: The leakage current on the MCLR pin is strongly dependent on the applied voltage level. The specified levels represent normal operating conditions. Higher leakage current may be measured at different input voltages. 3: Negative current is defined as current sourced by the pin. 4: This parameter is characterized, but not tested in manufacturing. |
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