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DM505LRBABF датащи(PDF) 99 Page - Texas Instruments |
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DM505LRBABF датащи(HTML) 99 Page - Texas Instruments |
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99 / 295 page ![]() V = V MAX (or V MAX) ref IL OL V = V MIN (or V MIN) ref IH OH pm_transvolt_prs403 Vref pm_io_volt_prs403 Transmission Line 4.0 pF 1.85 pF Z0 = 50 (see Note) Ω Tester Pin Electronics Data Sheet Timing Reference Point Output Under Test NOTE: The data sheet provides timing at the device pin. For output timing analysis, the tester pin electronics and its transmission line effects must be taken into account. A transmission line with a delay of 2 ns can be used to produce the desired transmission line effect. The transmission line is intended as a load only. It is not necessary to add or subtract the transmission line delay (2 ns) from the data sheet timings. Input requirements in this data sheet are tested with an input slew rate of < 4 Volts per nanosecond (4 V/ns) at the device pin. 42 Ω 3.5 nH Device Pin (see Note) pm_tstcirc_prs403 99 DM505 www.ti.com SPRS976E – NOVEMBER 2016 – REVISED MAY 2018 Submit Documentation Feedback Specifications Copyright © 2016–2018, Texas Instruments Incorporated 5.9.1.1 Parameter Information Figure 5-1. Test Load Circuit for AC Timing Measurements The load capacitance value stated is only for characterization and measurement of AC timing signals. This load capacitance value does not indicate the maximum load the device is capable of driving. 5.9.1.1.1 1.8V and 3.3V Signal Transition Levels All input and output timing parameters are referenced to Vref for both "0" and "1" logic levels. Vref = (VDD I/O)/2. Figure 5-2. Input and Output Voltage Reference Levels for AC Timing Measurements All rise and fall transition timing parameters are referenced to VIL MAX and VIH MIN for input clocks, VOL MAX and VOH MIN for output clocks. Figure 5-3. Rise and Fall Transition Time Voltage Reference Levels 5.9.1.1.2 1.8V and 3.3V Signal Transition Rates The default SLEWCONTROL settings in each pad configuration register must be used to guaranteed timings, unless specific instructions otherwise are given in the individual timing sub-sections of the datasheet. All timings are tested with an input edge rate of 4 volts per nanosecond (4 V/ns). |
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