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NAND02G-B2C датащи(PDF) 41 Page - STMicroelectronics |
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NAND02G-B2C датащи(HTML) 41 Page - STMicroelectronics |
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41 / 62 page ![]() NAND01G-B2B, NAND02G-B2C Maximum rating 41/62 10 Maximum rating Stressing the device above the ratings listed in Table 19: Absolute Maximum Ratings, may cause permanent damage to the device. These are stress ratings only and operation of the device at these or any other conditions above those indicated in the Operating sections of this specification is not implied. Exposure to Absolute Maximum Rating conditions for extended periods may affect device reliability. Refer also to the STMicroelectronics SURE Program and other relevant quality documents. Table 19. Absolute Maximum Ratings Symbol Parameter Value Unit Min Max TBIAS Temperature Under Bias – 50 125 °C TSTG Storage Temperature – 65 150 °C VIO (1) 1. Minimum Voltage may undershoot to –2V for less than 20ns during transitions on input and I/O pins. Maximum voltage may overshoot to VDD + 2V for less than 20ns during transitions on I/O pins. Input or Output Voltage 1.8V devices – 0.6 2.7 V 3 V devices – 0.6 4.6 V VDD Supply Voltage 1.8V devices – 0.6 2.7 V 3 V devices – 0.6 4.6 V |
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