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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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MPC885ZP80 датащи(PDF) 44 Page - NXP Semiconductors |
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MPC885ZP80 датащи(HTML) 44 Page - NXP Semiconductors |
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44 / 87 page  MPC885/MPC880 PowerQUICC Hardware Specifications, Rev. 7 44 Freescale Semiconductor IEEE 1149.1 Electrical Specifications 11 IEEE 1149.1 Electrical Specifications Table 15 provides the JTAG timings for the MPC885/MPC880 shown in Figure 38 through Figure 41. Figure 38. JTAG Test Clock Input Timing Table 15. JTAG Timing Num Characteristic All Frequencies Unit Min Max J82 TCK cycle time 100.00 — ns J83 TCK clock pulse width measured at 1.5 V 40.00 — ns J84 TCK rise and fall times 0.00 10.00 ns J85 TMS, TDI data setup time 5.00 — ns J86 TMS, TDI data hold time 25.00 — ns J87 TCK low to TDO data valid — 27.00 ns J88 TCK low to TDO data invalid 0.00 — ns J89 TCK low to TDO high impedance — 20.00 ns J90 TRST assert time 100.00 — ns J91 TRST setup time to TCK low 40.00 — ns J92 TCK falling edge to output valid — 50.00 ns J93 TCK falling edge to output valid out of high impedance — 50.00 ns J94 TCK falling edge to output high impedance — 50.00 ns J95 Boundary scan input valid to TCK rising edge 50.00 — ns J96 TCK rising edge to boundary scan input invalid 50.00 — ns TCK J82 J83 J82 J83 J84 J84 |
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