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MPC7450EC датащи(PDF) 22 Page - Motorola, Inc |
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MPC7450EC датащи(HTML) 22 Page - Motorola, Inc |
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22 / 52 page ![]() 22 MPC7450 RISC Microprocessor Hardware Specifications MOTOROLA Electrical and Thermal Characteristics Table 12 provides the L3 bus interface AC timing specifications for the configuration as shown in Figure 9, assuming the timing relationships shown in Figure 10 and the loading shown in Figure 8. Table 12. L3 Bus Interface AC Timing Specifications for MSUG2 At recommended operating conditions. See Table 4. Parameter Symbol All Speed Grades Unit Notes Min Max L3_CLK rise and fall time tL3CR and tL3CF — 1.0 ns 1 Setup times:Data and parity tL3DVEH and tL3DVEL –(tL3_ECHO_CLK/4 – 0.35) — ns 2, 3, 4 Input hold times:Data and parity tL3DXEH and tL3DXEL tL3_ECHO_CLK/4 + 0.35 — ns 2, 4 Valid times:Data and parity All other outputs tL3CHDV and tL3CLDV tL3CHOV — — –tL3_CLK/4 + 0.5 tL3_CLK/4 + 1.0 ns 5, 6, 7 5, 7 Output hold times: Data and parity All other outputs tL3CHDX and tL3CLDX tL3CHOX tL3_CLK/4 – 0.35 tL3_CLK/4 + 0.5 — — ns 5, 6, 7 5, 7 L3_CLK to high impedance: Data and parity All other outputs tL3CLDZ tL3CHOZ — — tL3_CLK/2 tL3_CLK/4 + 2.0 ns Notes: 1. Rise and fall times for the L3_CLK output are measured from 20% to 80% of GVDD. 2. For DDR, all input specifications are measured from the midpoint of the signal in question to the midpoint voltage of the rising or falling edge of the input L3_ECHO_CLKn (see Figure 10). Input timings are measured at the pins. 3. For DDR, the input data will typically follow the edge of L3_ECHO_CLKn as shown in Figure 10. For consistency with other input setup time specifications, this will be treated as negative input setup time. 4. tL3_ECHO_CLK/4 is one-fourth the period of L3_ECHO_CLKn. This parameter indicates that the MPC7450 can latch an input signal that is valid for only a short time before and a short time after the midpoint between the rising and falling (or falling and rising) edges of L3_ECHO_CLKn at any frequency. 5. All output specifications are measured from the midpoint voltage of the rising (or for DDR write data, also the falling) edge of L3_CLK to the midpoint of the signal in question. The output timings are measured at the pins. All output timings assume a purely resistive 50- Ω load (see Figure 8). 6. For DDR, the output data will typically lead the edge of L3_CLKn as shown in Figure 10. For consistency with other output valid time specifications, this will be treated as negative output valid time. 7. tL3_CLK/4 is one-fourth the period of L3_CLKn. This parameter indicates that the specified output signal is actually launched by an internal clock delayed in phase by 90°. Therefore, there is a frequency component to the output valid and output hold times such that the specified output signal will be valid for approximately one L3_CLK period starting three-fourths of a clock prior to the edge on which the SRAM will sample it and ending one-fourth of a clock period after the edge it will be sampled. Freescale Semiconductor, Inc. For More Information On This Product, Go to: www.freescale.com AR CH IVE D B Y F RE ES CA LE SE MI CO ND UC TO R, INC . |
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