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SPC56EL70L3 датащи(PDF) 82 Page - STMicroelectronics

номер детали SPC56EL70L3
подробное описание детали  4 KB instruction cache with error detection code
PDF  128 Pages
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производитель  STMICROELECTRONICS [STMicroelectronics]
домашняя страница  http://www.st.com
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SPC56EL70L3 датащи(HTML) 82 Page - STMicroelectronics

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Electrical characteristics
SPC56EL70L3, SPC56EL70L5,PC564L70L3, SPC564L70L5
82/128
DocID023953 Rev 5
EME testing was performed and documented according to these standards: [IEC 61967-2 &
-4]
EMS testing was performed and documented according to these standards: [IEC 62132-2 &
-4]
3.7
Electrostatic discharge (ESD) characteristics
Electrostatic discharges (a positive then a negative pulse separated by 1 second) are
applied to the pins of each sample according to each pin combination. The sample size
depends on the number of supply pins in the device (3 parts × (n + 1) supply pin). This test
conforms to the AEC-Q100-002/-003/-011 standard. For more details, refer to the
application note Electrostatic Discharge Sensitivity Measurement (AN1181).
Table 14. EMI emission testing specifications
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
VEME
CC Radiated emissions
Configuration A; frequency range
150 kHz–50 MHz
—10—
dB
V
Configuration A; frequency range 50–
150 MHz
—18—
Configuration A; frequency range 150–
500 MHz
—30—
Configuration A; frequency range 500–
1000 MHz
—18—
Configuration B; frequency range 50–
150 MHz
—10—
Configuration B; frequency range 50–
150 MHz
—18—
Configuration B; frequency range 150–
500 MHz
—30—
Configuration B; frequency range 500–
1000 MHz
—18—
Table 15. ESD ratings(1)(2)
No.
Symbol
Parameter
Conditions
Class Max value(3) Unit
1VESD(HBM)
SR
Electrostatic discharge
(Human Body Model)
TA = 25 °C
conforming to AEC-Q100-
002
H1C
2000
V
2VESD(MM)
SR
Electrostatic discharge
(Machine Model)
TA = 25 °C
conforming to AEC-Q100-
003
M2
200
V
3VESD(CDM)
SR
Electrostatic discharge
(Charged Device Model)
TA = 25 °C
conforming to AEC-Q100-
011
C3A
500
V
750
(corners)
1. All ESD testing is in conformity with CDF-AEC-Q100 Stress Test Qualification for Automotive Grade Integrated Circuits.



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