INA700 datasheet(32/50 Pages) TI

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8 Application and Implementation

Note

Information in the following applications sections is not part of the TI component specification,

and TI does not warrant its accuracy or completeness. TI’s customers are responsible for

determining suitability of components for their purposes, as well as validating and testing their design

implementation to confirm system functionality.

8.1 Application Information

8.1.1 Device Measurement Range and Resolution

Table 8-1 shows the full scale voltage on shunt, bus, and temperature measurements, along with their

associated step size.

Table 8-1. Register Full Scale Values and Resolution

PARAMETER

SIZE

FULL SCALE VALUE

RESOLUTION

Current

16 bit, signed

±15.728

480 µA/LSB

Bus voltage

16 bit, signed, always

positive

0 V to 40 V

3.125 mV/LSB

Die Temperature

12 bit, signed

–40°C to +150°C

125 m°C/LSB

Power

24 bit, unsigned

1.6106 kW

96 µW/LSB

Energy

40 bit, unsigned

1688.85 MJ

1.536 mJ/LSB

Charge

40 bit, signed

16.493 MC

30 µC/LSB

The internal die temperature sensor range extends from –256°C to +256°C but is limited by the junction

temperature range of –40°C to 125°C. Likewise, the bus voltage measurement range extends up to 102.4 V but

is limited by silicon to 40 V.

Current, bus voltage, temperature, power, energy, and charge measurements can be read through their

corresponding address registers. Values are calculated by multiplying the returned value by the corresponding

LSB size.

Signed values are represented in two's compliment format.

Upon overflow, the ENERGY register will roll over and start from zero. This register value can also be reset at

any time by setting the RSTACC bit in the CONFIG register.

An overflow event in the CHARGE register is indicated by the CHARGEOF bit. If an overflow condition occurs,

the CHARGE register must be manually reset by setting the RSTACC bit in the CONFIG register.

See Detailed Design Procedure for a design example using these equations.

8.1.2 ADC Output Data Rate and Noise Performance

The INA700 noise performance and effective resolution depend on the ADC conversion time. The device

also supports digital averaging which can further help decrease digital noise. The flexibility of the device to

select ADC conversion time and data averaging offers increased signal-to-noise ratio and achieves the highest

dynamic range with lowest offset. The profile of the noise at lower signals levels is dominated by the system

noise that is comprised mainly of 1/f noise or white noise. The INA700 effective resolution of the ADC can be

increased by increasing the conversion time and increasing the number of averages.

Table 8-2 shows the output data rate conversion settings supported by the device. The fastest conversion setting

is 50 µs. Typical noise-free resolution is represented as Effective Number of Bits (ENOB) based on device

measured data. The ENOB is calculated based on noise peak-to-peak values, which takes full noise distribution

into consideration. The conversion time for the temperature measurement is set to the power-on default value.

INA700

SBOSAB4A – MAY 2023 – REVISED SEPTEMBER 2023

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