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L9960 датащи(PDF) 60 Page - STMicroelectronics |
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L9960 датащи(HTML) 60 Page - STMicroelectronics |
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60 / 95 page ![]() Functional description L9960, L9960T 60/95 DS11115 Rev 10 4.8 Diagnostics and registers descriptions in case of validity bit configuration A detailed diagnostic of the H-bridge is available through SPI communication. The diagnostic words are used to report the following information: H-Bridge failures, H-bridge functional status, H-bridge HWSC test result. A detailed diagnostic is performed using a validity concept. The concept of the validity of the diagnostic is to provide the information “diagnostic done” OR “diagnostic NOT done”. 4.8.1 Diagnostic Reset strategy When diagnosis bits are latched, they can only be released by one of the following conditions: Transition from "Disable" (High) to "Enable" (Low) on DIS pin, Diagnostic register read by SPI (see details on each failure release) depending on "DIAG_CLR_EN" bit status, Reset condition. Usually, when the diagnostic register is reset, the bridge is switched back to normal mode driven by DIR and PWM or IN1 and IN2. All the settings are kept as before the failure. In case of SPI read, no additional action on DIS is needed. When the diagnosis is combined with a protection of the driver (driver put into tri-state), a reading by spi clears the diagnosis, but the bridge is released only at the next PWM rising edge event. Tionh Ion threshold filtering time Digital anti glitch filters on rising edge (guaranteed through scan) 123 µs Tionl Digital anti glitch filters on falling edge (guaranteed through scan) 123 µs Ihyst Current hysteresis on Ion Tj = -40°C to +150° 0.4 0.5 0.6 A Table 71. Over-current detection electrical characteristics (continued) Symbol Parameter Condition Min. Typ. Max. Unit |
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