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STM32F303C6 датащи(PDF) 74 Page - STMicroelectronics |
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STM32F303C6 датащи(HTML) 74 Page - STMicroelectronics |
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74 / 115 page ![]() Electrical characteristics STM32F303x6/x8 74/115 DocID025083 Rev 5 6.3.13 I/O current injection characteristics As a general rule, current injection to the I/O pins, due to external voltage below VSS or above VDD (for standard, 3 V-capable I/O pins) should be avoided during normal product operation. However, to give an indication of the robustness of the microcontroller in cases when abnormal injection accidentally happens, susceptibility tests are performed on a sample basis during device characterization. Functional susceptibility to I/O current injection While a simple application is executed on the device, the device is stressed by injecting current into the I/O pins programmed in floating input mode. While current is injected into the I/O pin, one at a time, the device is checked for functional failures. The failure is indicated by an out of range parameter: ADC error above a certain limit (higher than 5 LSB TUE), out of conventional limits of induced leakage current on adjacent pins (out of –5 µA/+0 µA range), or other functional failure (for example reset occurrence or oscillator frequency deviation). The test results are given in Table 51: I/O current injection susceptibility. Table 51. I/O current injection susceptibility Symbol Description Functional susceptibility Unit Negative injection Positive injection IINJ Injected current on BOOT0 – 0 NA mA Injected current on PC0, PC1, PC2, PC3 (TTa pins) and PF1 pin (FT pin) -0 +5 Injected current on PA0, PA1, PA2, PA3, PA4, PA5, PA6, PA7, PC4, PC5, PB0, PB1, PB2, PB12, PB13, PB14, PB15 with induced leakage current on other pins from this group less than -100 µA or more than +900 µA -5 +5 Injected current on PB11, other TT, FT, and FTf pins – 5 NA Injected current on all other TC, TTa and RESET pins – 5 +5 |
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