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TMS570LS0332PZ датащи(PDF) 33 Page - Texas Instruments |
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TMS570LS0332PZ датащи(HTML) 33 Page - Texas Instruments |
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33 / 110 page ![]() TMS570LS0432, TMS570LS0332 www.ti.com SPNS186B – OCTOBER 2012 – REVISED JUNE 2015 6.4.6.1 Application Sequence for CPU Self-Test 1. Configure clock domain frequencies. 2. Select the number of test intervals to be run. 3. Configure the timeout period for the self-test run. 4. Save the CPU state if required 5. Enable self-test. 6. Wait for CPU reset. 7. In the reset handler, read CPU self-test status to identify any failures. 8. Retrieve CPU state if required. For more information, see the TMS570LS04x/03x 16/32-Bit RISC Flash Microcontroller Technical Reference Manual (SPNU517). 6.4.6.2 CPU Self-Test Clock Configuration The maximum clock rate for the self-test is 45 MHz. The STCCLK is divided down from the CPU clock, when necessary. This divider is configured by the STCCLKDIV register at address 0xFFFFE108. 6.4.6.3 CPU Self-Test Coverage Table 6-7 shows CPU test coverage achieved for each self-test interval. It also lists the cumulative test cycles. The test time can be calculated by multiplying the number of test cycles with the STC clock period. Table 6-7. CPU Self-Test Coverage INTERVALS TEST COVERAGE, % TEST CYCLES 0 0 0 1 60.06 1365 2 68.71 2730 3 73.35 4095 4 76.57 5460 5 78.7 6825 6 80.4 8190 7 81.76 9555 8 82.94 10920 9 83.84 12285 10 84.58 13650 11 85.31 15015 12 85.9 16380 13 86.59 17745 14 87.17 19110 15 87.67 20475 16 88.11 21840 17 88.53 23205 18 88.93 24570 19 89.26 25935 20 89.56 27300 21 89.86 28665 22 90.1 30030 23 90.36 31395 24 90.62 32760 Copyright © 2012–2015, Texas Instruments Incorporated System Information and Electrical Specifications 33 Submit Documentation Feedback Product Folder Links: TMS570LS0432 TMS570LS0332 |
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