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ACT5880 датащи(PDF) 74 Page - Active-Semi, Inc |
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ACT5880 датащи(HTML) 74 Page - Active-Semi, Inc |
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74 / 87 page ![]() ACT5880 Rev 2, 03-Sep-13 - 74 - www.active-semi.com ActivePMU TM and ActivePathTM are trademarks of Active-Semi. I2CTM is a trademark of NXP. Copyright © 2013 Active-Semi, Inc. Active-Semi Confidential―Do Not Copy or Distribute 2 and channel 3 read the 2 coordinate equivalences Z2 and Z1 on Z axis. These Z2 and Z1 are used for contact evaluation; Refer to Contact Evaluation for more details. Figure 11: The Simplified Circuits for Touch Screen Measuring. Touch Detection When the function is enabled, the touch detection circuit measures the contact between two film layers of the touch screen panel. The detection circuit only biases the XPOS in standby when no any conversion in progress and no conversion result waiting for system to read. When contact between 2 film layers happens, a touch event is detected and an interrupt asserts for request system service. The layer to layer coupling may cause false touch detection when applying the bias, the first touch event right after applying should be ignored. A wake-up against pen touch detection function is designed for further power saving in applications like E-book, in which the main processor may power off. To enable this function, the PENWKEN bit needs to be set and the TSC ADC circuit needs to be powered independently to the operation of the ACT5880, such as being powered with battery directly. Contact Evaluation The (Z1−Z2) read the resistive divide ratio of the contact impedance over the whole force path impedance. As the film resistors in the path are coordinate dependent, the (Z1−Z2) are consequently X coordinate and Y coordinate dependent. The linear estimation on the film resistor impedances are used to normalize the (Z1−Z2) to proportional factor C to one of the two film impedances. As a sample, giving the effective dimensions of the touch films is 1:F for X-dimension to Y-dimension ratio and the X film impedance is 1, the Y film impedance is then F and the film thickness is same; Also giving the full scale reading is FS, the Y film resistor impedance in the path is (FS−Y)·F, the C is derived as: C=(Z1−Z2)·[X+(FS−Y)]⁄[FS−(Z1−Z2)]. The volume C represents the tightness of contact in the touch spot, which is proportional to the touch pressure and touch area size. The high resolution conversion, the reference buffer force driving and the flexible acquisition features make the ACT5880 suitable for contact evaluation applications like finger touch and fingers touch. The finger touch has low contact impedance than the round tip touch; the C volume can be used to detect the finger touch. With two additional I/O pins to pull the Hi-Z pins in channel 2 and channel 3 connections to ground separately, the equivalent span changes of the touch spot on X axis and Y axis can be evaluated, so forth the 2 fingers wiping shaped touch is identified. See connections in Figure 12 for reference. Figure 12: The 2 Fingers Touch Measuring. Internal Reference The TSC ADC circuit has an internal reference buffer to generate a 2.5V reference voltage for the ADC circuit and the force driving in the analogue front end. This reference is user trim-able for getting better accuracy is necessary. Refer to the REGISTER AND BIT DESCRIPTIONS section for more details. YPOS: 2.5V YNEG : GND XNEG: Hi-Z XPOS: ADC Channel :0 Y-coordinate YPOS: ADC YNEG : Hi-Z XNEG: GND XPOS: 2.5V Channel :1 X-coordinate YNEG : Hi-Z XPOS: ADC Channel :2 Z2-coordinate YPOS : 2.5V YNEG : ADC XNEG: GND XPOS: Hi-Z Channel :3 Z1-coordinate YPOS: 2.5V XNEG: GND YNEG: GND XPOS : ADC Ytouch spot span evaluation , the YNEGgrounded during Channel 2measurement . YPOS: 2.5V YNEG: ADC XNEG: GND XPOS: GND YPOS: 2.5V XNEG: GND Xtouch spot span evaluation , theYNEGgrounded during Channel 3 measurement. |
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