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MPC8548ECPXATHC датащи(PDF) 135 Page - Freescale Semiconductor, Inc |
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MPC8548ECPXATHC датащи(HTML) 135 Page - Freescale Semiconductor, Inc |
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135 / 151 page ![]() MPC8548E PowerQUICC III Integrated Processor Hardware Specifications, Rev. 9 Freescale Semiconductor 135 System Design Information 21.3 Heat Sink Solution Every system application has different conditions that the thermal management solution must solve. As such, providing a recommended heat sink has not been found to be very useful. When a heat sink is chosen, give special consideration to the mounting technique. Mounting the heat sink to the printed-circuit board is the recommended procedure using a maximum of 10 lbs force (45 Newtons) perpendicular to the package and board. Clipping the heat sink to the package is not recommended. 22 System Design Information This section provides electrical design recommendations for successful application of the device. 22.1 System Clocking This device includes five PLLs, as follows: 1. The platform PLL generates the platform clock from the externally supplied SYSCLK input. The frequency ratio between the platform and SYSCLK is selected using the platform PLL ratio configuration bits as described in Section 20.2, “CCB/SYSCLK PLL Ratio.” 2. The e500 core PLL generates the core clock as a slave to the platform clock. The frequency ratio between the e500 core clock and the platform clock is selected using the e500 PLL ratio configuration bits as described in Section 20.3, “e500 Core PLL Ratio.” 3. The PCI PLL generates the clocking for the PCI bus. 4. The local bus PLL generates the clock for the local bus. 5. There is a PLL for the SerDes block. 22.2 PLL Power Supply Filtering Each of the PLLs listed above is provided with power through independent power supply pins (AVDD_PLAT, AVDD_CORE, AVDD_PCI, AVDD_LBIU, and AVDD_SRDS, respectively). The AVDD Die junction-to-board N/A RJB 5°C/W 3 Die junction-to-case N/A RJC 0.8 °C/W 4 Notes: 1. Junction temperature is a function of die size, on-chip power dissipation, package thermal resistance, mounting site (board) temperature, ambient temperature, airflow, power dissipation of other components on the board, and board thermal resistance. 2. Per JEDEC JESD51-6 with the board (JESD51-7) horizontal. 3. Thermal resistance between the die and the printed circuit board per JEDEC JESD51-8. Board temperature is measured on the top surface of the board near the package. 4. Thermal resistance between the die and the case top surface as measured by the cold plate method (MIL SPEC-883 Method 1012.1). The cold plate temperature is used for the case temperature, measured value includes the thermal resistance of the interface layer. Table 85. Package Thermal Characteristics for FC-PBGA (continued) Characteristic JEDEC Board Symbol Value Unit Notes |
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