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CDCE72010RGCT датащи(PDF) 60 Page - Texas Instruments |
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CDCE72010RGCT датащи(HTML) 60 Page - Texas Instruments |
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60 / 73 page ![]() DEVICE LAYOUT Onlyonesideofthepinpadsisshown. Onlytwocapacitorsareillustrated. TopSideThermalPADLayout BottomSideThermalPADLayout Onlytwocapacitorsareillustrated. CDCE72010 SCAS858A – JUNE 2008 – REVISED JULY 2009.............................................................................................................................................................. www.ti.com The CDCE72010 is a high performance device packaged in a QFN-64. The die has all the ground pins bounded to the thermal PAD on the bottom of the package. Therefore it is essential that the connection from the thermal PAD to the ground layers should be low impedance. In addition, the thermal path in a QFN package is via the thermal PAD on the bottom of the package. Therefore, the layout of the PAD is very important and it will affect the thermal performance as well as the overall performance of the device. The illustration shown provides optimal performance in terms of thermal issues, inductance and power supply bypassing. The 10 X 10 Filled VIA pattern recommended allows for a low inductance connection between the thermal ground pad and the ground plane of the board. This pattern forms a low thermal resistive path for the heat generated by the die to get dissipated through the ground plane and to the exposed bottom side ground pad. It is recommended that solder mask not be used on this bottom side pad to maximize its effectiveness as a thermal heat sink. The recommended layout drives the thermal conductivity to 22.8 C/W in still air and 13.8 C/W in a 100LFM air flow if implemented on a JEDEC compliant test thermal board. Figure 26. Device Layout 60 Submit Documentation Feedback Copyright © 2008–2009, Texas Instruments Incorporated Product Folder Link(s): CDCE72010 |
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