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MCP4728 датащи(PDF) 5 Page - Microchip Technology

номер детали MCP4728
подробное описание детали  12-Bit, Quad Digital-to-Analog Converter with EEPROM Memory
PDF  66 Pages
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производитель  MICROCHIP [Microchip Technology]
домашняя страница  http://www.microchip.com
Logo MICROCHIP - Microchip Technology

MCP4728 датащи(HTML) 5 Page - Microchip Technology

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© 2009 Microchip Technology Inc.
DS22187C-page 5
MCP4728
Full Scale Range
(Note 7)
FSR
—
VDD
—V
VREF = VDD
FSR = from 0.0V to VDD
—VREF
—V
VREF = Internal, Gx =1,
FSR = from 0.0 V to VREF
—2 * VREF
—V
VREF = Internal, Gx =2,
FSR = from 0.0V to 2*VREF
Output Voltage Settling
Time
TSETTLING
—6
—
µs
(Note 8)
Analog Output Time Delay
from Power-Down Mode
TdExPD
—4.5
—
µs
VDD = 5V, (Note 4), (Note 9)
Time delay to settle to new
reference
(Note 4)
TdREF
—
26
—
µs
From External to Internal
Reference
—
44
—
µs
From Internal to External
Reference
Power Supply Rejection
PSRR
—
-57
—
dB
VDD = 5V± 10%, VREF = Internal
Capacitive Load Stability
CL
—
—
1000
pF
RL = 5 kΩ, No Oscillation, (Note 4)
Slew Rate
SR
—
0.55
—
V/µs
Phase Margin
pM
—
66
—
Degree
(°)
CL = 400 pF, RL = ∞
Short Circuit Current
ISC
—15
24
mA
VDD = 5V,
All VOUT Pins = Grounded.
Tested at room temperature.
Short Circuit Current
Duration
TSC_DUR
—
Infinite
—
hours
(Note 4)
DC Output Impedance
(Note 4)
ROUT
—1
—
Ω
Normal mode
—1
—
k
Ω
Power-Down Mode 1
(PD1:PD0 = 0:1), VOUT to VSS
—100
—
k
Ω
Power-Down Mode 2
(PD1:PD0 = 1:0), VOUT to VSS
—500
—
k
Ω
Power-Down Mode 3
(PD1:PD0 = 1:1), VOUT to VSS
Dynamic Performance (Note 4)
Major Code Transition
Glitch
—
45
—
nV-s
1 LSB code change around major
carry (from 7FFh to 800h)
Digital Feedthrough
—
<10
—
nV-s
Analog Crosstalk
—
<10
—
nV-s
ELECTRICAL CHARACTERISTICS (CONTINUED)
Electrical Specifications: Unless otherwise indicated, all parameters apply at V
DD = + 2.7V to 5.5V, VSS = 0V,
RL = 5 kΩ, CL = 100 pF, GX = 1, TA = -40°C to +125°C. Typical values are at +25°C, VIH = VDD, VIL = VSS.
Parameter
Symbol
Min
Typical
Max
Units
Conditions
Note 1: All digital input pins (SDA, SCL, LDAC) are tied to “High”, Output pins are unloaded, code = 0x000.
2: The power-up ramp rate measures the rise of V
DD over time.
3: This parameter is ensured by design and not 100% tested.
4: This parameter is ensured by characterization and not 100% tested.
5: Test code range: 100 - 4000 codes, V
REF = VDD, VDD = 5.5V.
6: Time delay to settle to a new reference when switching from external to internal reference or vice versa.
7: This parameter is indirectly tested by Offset and Gain error testing.
8: Within 1/2 LSB of the final value when code changes from 1/4 of to 3/4 of full scale.
9: This time delay is measured from the falling edge of ACK pulse in I2C command to the beginning of V
OUT.
This time delay is not included in the output settling time specification.



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