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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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SPSB081 датащи(PDF) 84 Page - STMicroelectronics |
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SPSB081 датащи(HTML) 84 Page - STMicroelectronics |
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84 / 137 page  6 Application Figure 40. Typical application diagram CSN CLK DO DI V1 WU1 CM V2 NRESET VSREG DIR/WU2 OUT4(7Ω, 140mA) TxD_C RxD_L TxD_L RxD_C VCANSUP OUT1(7Ω, 140mA) DEBUG OUT2(7Ω, 140mA) OUT3(7Ω, 140mA) DIAGN VS External Load Vbat µc µc Contact Monitoring for Wake Up OUT4 Microcontroller µc 1KΩ 1KΩ 1KΩ 1KΩ 1KΩ PGND VREG 1 VTRCK2 SGND Direct Drive HSP-Channel Thermal Clusters HSP-Channel HSP-Channel HSP-Channel VCANSUP NINT 1KΩ 1KΩ 1KΩ 1µF 1µF 47nF 47nF 47nF 47nF CAN_H CAN_L (1) LIN 1) ST ESDCAN04-2BWY is needed only for SAE J2962-2 compliance 2) ST ESDLIN1524BJ is needed only for SAE J2962-1 compliance 3) In case a LIN/CAN conformance test has to be executed on the device, suitable capacitors have to be placed on the Fixed-Function-Unit pins (3) (3) (2) SPSB081 Application DS14048 - Rev 3 page 84/137 |
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